John T. Eagan

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Cary, NC, US

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Patents Grantslast 30 patents

Information Patent Grant
Thin layer nuclear density gauge
- Patent number 6,442,232
- Issue date Aug 27, 2002
- Troxler Electronic Laboratories, Inc.
- Robert E. Troxler
- G01 - MEASURING TESTING
Information Patent Grant
Thin layer nuclear density guage
- Patent number 6,310,936
- Issue date Oct 30, 2001
- Troxler Electronic Laboratories, Inc.
- Robert E. Troxler
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for measuring rutting susceptibility
- Patent number 5,969,261
- Issue date Oct 19, 1999
- Troxler Electronics Laboratories, Inc.
- Donald K. McAlister
- G01 - MEASURING TESTING
Information Patent Grant
Gyratory compactor
- Patent number 5,939,642
- Issue date Aug 17, 1999
- Troxler Electronic Laboratories, Inc.
- Michael L. King
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for compacting material samples
- Patent number 5,323,655
- Issue date Jun 28, 1994
- Troxler Electronic Laboratories, Inc.
- John T. Eagan
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Thin layer nuclear density gauge
- Publication number 20010055363
- Publication date Dec 27, 2001
- Troxler Electronic Laboratories, Inc.
- Robert E. Troxler
- G01 - MEASURING TESTING