JOHN T. STROM

Person

North Bend, WA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Probe card analysis system and method
- Patent number 9,638,782
- Issue date May 2, 2017
- Rudolph Technologies, Inc.
- Eric Endres
- G01 - MEASURING TESTING
Information Patent Grant
Probe card analysis system and method
- Patent number 8,466,703
- Issue date Jun 18, 2013
- Rudolph Technologies, Inc.
- Eric Endres
- G01 - MEASURING TESTING
Information Patent Grant
Probe mark inspection
- Patent number 8,358,831
- Issue date Jan 22, 2013
- Rudolph Technologies, Inc.
- Rodney Doe
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of applying the analysis of scrub mark morphology and locati...
- Patent number 8,198,906
- Issue date Jun 12, 2012
- Rudolph Technologies, Inc.
- John T. Strom
- G01 - MEASURING TESTING
Information Patent Grant
System and method of measuring probe float
- Patent number 8,089,292
- Issue date Jan 3, 2012
- Rudolph Technologies, Inc.
- John T. Strom
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for obtaining planarity measurements with respect to a pr...
- Patent number 7,960,981
- Issue date Jun 14, 2011
- Rudolph Technologies, Inc.
- John T. Strom
- G01 - MEASURING TESTING
Information Patent Grant
Method of applying the analysis of scrub mark morphology and locati...
- Patent number 7,750,622
- Issue date Jul 6, 2010
- Rudolph Technologies, Inc.
- John T. Strom
- G01 - MEASURING TESTING
Information Patent Grant
Stereoscopic three-dimensional metrology system and method
- Patent number 7,634,128
- Issue date Dec 15, 2009
- Rudolph Technologies, Inc.
- Donald B. Snow
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Dual-axis scanning system and method
- Patent number 7,634,129
- Issue date Dec 15, 2009
- Rudolph Technologies, Inc.
- John T. Strom
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method of measuring probe float
- Patent number 7,633,306
- Issue date Dec 15, 2009
- Rudolph Technologies, Inc.
- John T. Strom
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for obtaining planarity measurements with respect to a pr...
- Patent number 7,579,853
- Issue date Aug 25, 2009
- Rudolph Technologies, Inc.
- John T. Strom
- G01 - MEASURING TESTING
Information Patent Grant
System and method of mitigating effects of component deflection in...
- Patent number 7,385,409
- Issue date Jun 10, 2008
- Rudolph Technologies, Inc.
- John T. Strom
- G01 - MEASURING TESTING
Information Patent Grant
Stereoscopic three-dimensional metrology system and method
- Patent number 7,231,081
- Issue date Jun 12, 2007
- Applied Precision, LLC
- Donald B. Snow
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method of mitigating effects of component deflection in...
- Patent number 7,170,307
- Issue date Jan 30, 2007
- Applied Precision, LLC
- John T. Strom
- G01 - MEASURING TESTING
Information Patent Grant
Method of applying the analysis of scrub mark morphology and locati...
- Patent number 7,102,368
- Issue date Sep 5, 2006
- Applied Precision, LLC
- John T. Strom
- G01 - MEASURING TESTING
Information Patent Grant
Coordinate calibration for scanning systems
- Patent number 7,062,091
- Issue date Jun 13, 2006
- Applied Precision, LLC
- Carl S. Brown
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for optimizing probe card analysis and scrub mark analysis data
- Patent number 6,621,262
- Issue date Sep 16, 2003
- Applied Precision, LLC
- John Strom
- G01 - MEASURING TESTING
Information Patent Grant
Method for optimizing probe card analysis and scrub mark analysis data
- Patent number 6,414,477
- Issue date Jul 2, 2002
- Applied Precision, Inc.
- John Strom
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
PROBE CARD ANALYSIS SYSTEM AND METHOD
- Publication number 20140021970
- Publication date Jan 23, 2014
- Eric Endres
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL INSPECTION OPTIMIZATION
- Publication number 20120189189
- Publication date Jul 26, 2012
- Rudolph Technologies Inc.
- Rodney Bryan Doe
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
APPARATUS FOR OBTAINING PLANARITY MEASUREMENTS WITH RESPECT TO A PR...
- Publication number 20120150475
- Publication date Jun 14, 2012
- Rudolph Technologies, Inc.
- John T. Strom
- G01 - MEASURING TESTING
Information Patent Application
PROBE CARD ANALYSIS SYSTEM AND METHOD
- Publication number 20110089965
- Publication date Apr 21, 2011
- Rudolph Technologies, Inc.
- Eric Endres
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD OF MEASURING PROBE FLOAT
- Publication number 20100321056
- Publication date Dec 23, 2010
- Rudolph Technologies, Inc.
- John T. Strom
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF APPLYING THE ANALYSIS OF SCRUB MARK MORPHOLOGY AND LOCATI...
- Publication number 20100305897
- Publication date Dec 2, 2010
- Rudolph Technologies, Inc.
- JOHN T. STROM
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS FOR OBTAINING PLANARITY MEASUREMENTS WITH RESPECT TO A PR...
- Publication number 20100073019
- Publication date Mar 25, 2010
- Rudolph Technologies, Inc.
- John T. Strom
- G01 - MEASURING TESTING
Information Patent Application
PROBE MARK INSPECTION
- Publication number 20100061620
- Publication date Mar 11, 2010
- Rudolph Technologies, Inc.
- Rodney Doe
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM AND METHOD OF MITIGATING EFFECTS OF COMPONENT DEFLECTION IN...
- Publication number 20080238464
- Publication date Oct 2, 2008
- Rudolph Technologies, Inc.
- JOHN T. STROM
- G01 - MEASURING TESTING
Information Patent Application
STEREOSCOPIC THREE-DIMENSIONAL METROLOGY SYSTEM AND METHOD
- Publication number 20070269103
- Publication date Nov 22, 2007
- Applied Precision, LLC
- DONALD B. SNOW
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM AND METHOD OF MITIGATING EFFECTS OF COMPONENT DEFLECTION IN...
- Publication number 20070103181
- Publication date May 10, 2007
- Applied Precision, LLC
- John T. Strom
- G01 - MEASURING TESTING
Information Patent Application
Method of applying the analysis of scrub mark morphology and locati...
- Publication number 20060244438
- Publication date Nov 2, 2006
- Applied Precision, LLC
- John T. Strom
- G01 - MEASURING TESTING
Information Patent Application
System and method of mitigating effects of component deflection in...
- Publication number 20040227533
- Publication date Nov 18, 2004
- John T. Strom
- G01 - MEASURING TESTING
Information Patent Application
Method of applying the analysis of scrub mark morphology and locati...
- Publication number 20040227504
- Publication date Nov 18, 2004
- Applied Precision, LLC
- John T. Strom
- G01 - MEASURING TESTING
Information Patent Application
System and method of measuring probe float
- Publication number 20040222808
- Publication date Nov 11, 2004
- John T. Strom
- G01 - MEASURING TESTING
Information Patent Application
Stereoscopic three-dimensional metrology system and method
- Publication number 20030142862
- Publication date Jul 31, 2003
- Donald B. Snow
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Dual-axis scanning system and method
- Publication number 20030138139
- Publication date Jul 24, 2003
- John T. Strom
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method for optimizing probe card analysis and scrub mark analysis data
- Publication number 20020171414
- Publication date Nov 21, 2002
- Applied Precision, LLC, a Washington corporation
- John Strom
- G01 - MEASURING TESTING
Information Patent Application
Method and process of applying the analysis of scrub mark morpholog...
- Publication number 20020097062
- Publication date Jul 25, 2002
- John Timothy Strom
- G01 - MEASURING TESTING
Information Patent Application
Coordinate calibration for scanning systems
- Publication number 20020097898
- Publication date Jul 25, 2002
- Carl S. Brown
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL

JOHN T. STROM

Person

Patents Grantslast 30 patents

Probe card analysis system and method

Probe card analysis system and method

Probe mark inspection

Method of applying the analysis of scrub mark morphology and locati...

System and method of measuring probe float

Apparatus for obtaining planarity measurements with respect to a pr...

Method of applying the analysis of scrub mark morphology and locati...

Stereoscopic three-dimensional metrology system and method

Dual-axis scanning system and method

System and method of measuring probe float

Apparatus for obtaining planarity measurements with respect to a pr...

System and method of mitigating effects of component deflection in...

Stereoscopic three-dimensional metrology system and method

System and method of mitigating effects of component deflection in...

Method of applying the analysis of scrub mark morphology and locati...

Coordinate calibration for scanning systems

Method for optimizing probe card analysis and scrub mark analysis data

Method for optimizing probe card analysis and scrub mark analysis data

Patents Applicationslast 30 patents

PROBE CARD ANALYSIS SYSTEM AND METHOD

OPTICAL INSPECTION OPTIMIZATION

APPARATUS FOR OBTAINING PLANARITY MEASUREMENTS WITH RESPECT TO A PR...

PROBE CARD ANALYSIS SYSTEM AND METHOD

SYSTEM AND METHOD OF MEASURING PROBE FLOAT

METHOD OF APPLYING THE ANALYSIS OF SCRUB MARK MORPHOLOGY AND LOCATI...

APPARATUS FOR OBTAINING PLANARITY MEASUREMENTS WITH RESPECT TO A PR...

PROBE MARK INSPECTION

SYSTEM AND METHOD OF MITIGATING EFFECTS OF COMPONENT DEFLECTION IN...

STEREOSCOPIC THREE-DIMENSIONAL METROLOGY SYSTEM AND METHOD

SYSTEM AND METHOD OF MITIGATING EFFECTS OF COMPONENT DEFLECTION IN...

Method of applying the analysis of scrub mark morphology and locati...

System and method of mitigating effects of component deflection in...

Method of applying the analysis of scrub mark morphology and locati...

System and method of measuring probe float

Stereoscopic three-dimensional metrology system and method

Dual-axis scanning system and method

Method for optimizing probe card analysis and scrub mark analysis data

Method and process of applying the analysis of scrub mark morpholog...

Coordinate calibration for scanning systems