TREA

John Thomas Josefosky

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  • San Diego, CA, US
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Patents Grantslast 30 patents

  • Information Patent Grant

    Transformer within wafer test probe
    • Patent number 8,638,114
    • Issue date Jan 28, 2014
    • QUALCOMM Incorporated
    • John T Josefosky
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Probe card actuator
    • Patent number 8,008,936
    • Issue date Aug 30, 2011
    • Qualcomm, Incorporated
    • James A. Clarke
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents

  • Information Patent Application

    TRANSFORMER WITHIN WAFER TEST PROBE
    • Publication number 20110133766
    • Publication date Jun 9, 2011
    • QUALCOMM Incorporated
    • John T. Josefosky
    • G01 - MEASURING TESTING
  • Information Patent Application

    PROBE CARD ACTUATOR
    • Publication number 20100117669
    • Publication date May 13, 2010
    • QUALCOMM Incorporated
    • James A. Clarke
    • G01 - MEASURING TESTING