John Thornell

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Richardson, TX, US

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Patents Grantslast 30 patents

Information Patent Grant
Inspection of substrates
- Patent number 10,553,504
- Issue date Feb 4, 2020
- Rudolph Technologies, Inc.
- Gurvinder Singh
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device inspection of metallic discontinuities
- Patent number 10,466,179
- Issue date Nov 5, 2019
- Rudoplh Technologies, Inc.
- Gurvinder Singh
- G01 - MEASURING TESTING
Information Patent Grant
System and method of characterizing micro-fabrication processes
- Patent number 10,024,804
- Issue date Jul 17, 2018
- Rudolph Technologies, Inc.
- John Thornell
- G01 - MEASURING TESTING
Information Patent Grant
System and method of characterizing micro-fabrication processes
- Patent number 9,658,169
- Issue date May 23, 2017
- Rudolph Technologies, Inc.
- John Thornell
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
PHOTO RESPONSE NON-UNIFORMITY CORRECTION DURING SEMICONDUCTOR INSPE...
- Publication number 20250003888
- Publication date Jan 2, 2025
- Onto Innovation Inc.
- John M. Thornell
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INSPECTION OF SUBSTRATES
- Publication number 20180277452
- Publication date Sep 27, 2018
- Rudolph Technologies, Inc.
- Gurvinder Singh
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR DEVICE INSPECTION OF METALLIC DISCONTINUITIES
- Publication number 20180275063
- Publication date Sep 27, 2018
- Rudolph Technologies, Inc.
- Gurvinder Singh
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD OF CHARACTERIZING MICRO-FABRICATION PROCESSES
- Publication number 20170254757
- Publication date Sep 7, 2017
- Rudolph Technologies, Inc.
- John Thornell
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD OF CHARACTERIZING MICRO-FABRICATION PROCESSES
- Publication number 20150316487
- Publication date Nov 5, 2015
- Rudolph Technologies, Inc.
- John Thornell
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD OF CHARACTERIZING MICRO-FABRICATION PROCESSES
- Publication number 20140320635
- Publication date Oct 30, 2014
- Rudolph Technologies, Inc.
- John Thornell
- G01 - MEASURING TESTING