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John Tingay
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Cottenham, GB
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Patents Grants
last 30 patents
Information
Patent Grant
X-ray inspection apparatus
Patent number
10,393,675
Issue date
Aug 27, 2019
Nordson Corporation
John Tingay
G01 - MEASURING TESTING
Information
Patent Grant
X-ray inspection apparatus for inspecting semiconductor wafers
Patent number
10,215,716
Issue date
Feb 26, 2019
Nordson Corporation
John Tingay
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for generating a three-dimensional model of a...
Patent number
9,442,080
Issue date
Sep 13, 2016
Nordson Corporation
Dragos Golubovic
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for generating a three-dimensional model of a...
Patent number
9,129,427
Issue date
Sep 8, 2015
Nordson Corporation
Dragos Golubovic
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Substrate loading and unloading apparatus
Patent number
7,783,377
Issue date
Aug 24, 2010
Leica Microsystems Lithography
Paul Harris
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Device for influencing an electron beam
Patent number
6,885,009
Issue date
Apr 26, 2005
Leica Microsystems Lithography, Ltd.
John Tingay
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
X-RAY INSPECTION APPARATUS
Publication number
20170025317
Publication date
Jan 26, 2017
Nordson Corporation
John TINGAY
G01 - MEASURING TESTING
Information
Patent Application
X-RAY INSPECTION APPARATUS FOR INSPECTING SEMICONDUCTOR WAFERS
Publication number
20170011973
Publication date
Jan 12, 2017
Nordson Corporation
John Tingay
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND APPARATUS FOR GENERATING A THREE-DIMENSIONAL MODEL OF A...
Publication number
20150369757
Publication date
Dec 24, 2015
Nordson Corporation
Dragos Golubovic
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND APPARATUS FOR GENERATING A THREE-DIMENSIONAL MODEL OF A...
Publication number
20130108017
Publication date
May 2, 2013
Nordson Corporation
Dragos Golubovic
G01 - MEASURING TESTING
Information
Patent Application
REDUCTION IN STAGE MOVEMENT REACTION FORCE IN AN ELECTRON BEAM LITH...
Publication number
20100096567
Publication date
Apr 22, 2010
VISTEC LITHOGRAPHY INC.
Paul George Harris
B82 - NANO-TECHNOLOGY
Information
Patent Application
Substrate loading and unloading apparatus
Publication number
20040037676
Publication date
Feb 26, 2004
Paul Harris
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Device for influencing an electron beam
Publication number
20030230727
Publication date
Dec 18, 2003
LEICA MICROSYSTEMS LITHOGRAPHY LTD.
John Tingay
H01 - BASIC ELECTRIC ELEMENTS