Lexington, MA, US
Information
Patent Grant
Ikigai Labs, Inc.
Devavrat Dilitkumar Shah
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
SiRF Technology, Inc.
Anant Sahai
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
SiRF Technology, Inc.
Nainesh Agarwal
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
SiRF Technology, Inc.
Anant Sahai
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
SiRF Technology, Inc.
Anant Sahai
G01 - MEASURING TESTING
Information
Patent Grant
Enuvis, Inc.
Anant Sahai
G01 - MEASURING TESTING
Information
Patent Grant
Enuvis, Inc.
Benjamin Van Roy
G01 - MEASURING TESTING
Information
Patent Grant
Enuvis, Inc.
Andrew Chou
G01 - MEASURING TESTING
Information
Patent Application
Ikigai Labs, Inc.
Devavrat Dilitkumar Shah
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
Nainesh Agarwal
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
SiRF Technology, Inc.
Nainesh Agarwal
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
Anant Sahai
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Anant Sahai
G01 - MEASURING TESTING
Information
Patent Application
Benjamin Van Roy
G01 - MEASURING TESTING
Information
Patent Application
Andrew Chou
G01 - MEASURING TESTING
