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John V. Bucci
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Midland, MI, US
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Patents Grants
last 30 patents
Information
Patent Grant
Dichlorosilane compensating control strategy for improved polycryst...
Patent number
10,851,459
Issue date
Dec 1, 2020
HEMLOCK SEMICONDUCTOR OPERATIONS LLC
John Victor Bucci
C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information
Patent Grant
Tapered fluidized bed reactor and process for its use
Patent number
10,265,671
Issue date
Apr 23, 2019
HEMLOCK SEMICONDUCTOR OPERATIONS LLC
John V. Bucci
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Grant
Tapered fluidized bed reactor and process for its use
Patent number
10,105,669
Issue date
Oct 23, 2018
HEMLOCK SEMICONDUCTOR OPERATIONS LLC
John V. Bucci
C01 - INORGANIC CHEMISTRY
Information
Patent Grant
Surface conditioning of conveyor materials or contact surfaces
Patent number
10,005,614
Issue date
Jun 26, 2018
HEMLOCK SEMICONDUCTOR OPERATIONS LLC
Jonathan Patrick Berrie
B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Patents Applications
last 30 patents
Information
Patent Application
TAPERED FLUIDIZED BED REACTOR AND PROCESS FOR ITS USE
Publication number
20190030506
Publication date
Jan 31, 2019
Hemlock Semiconductor Operations LLC
John V. Bucci
C01 - INORGANIC CHEMISTRY
Information
Patent Application
SURFACE CONDITIONING OF CONVEYOR MATERIALS OR CONTACT SURFACES
Publication number
20170246641
Publication date
Aug 31, 2017
HEMLOCK SEMICONDUCTOR CORPORATION
Jonathan Patrick Berrie
B02 - CRUSHING, PULVERISING, OR DISINTEGRATING PREPARATORY TREATMENT OF GRAIN...
Information
Patent Application
DICHLOROSILANE COMPENSATING CONTROL STRATEGY FOR IMPROVED POLYCRYST...
Publication number
20170058403
Publication date
Mar 2, 2017
HEMLOCK SEMICONDUCTOR CORPORATION
John Victor Bucci
C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information
Patent Application
TAPER FLUIDIZED BED REACTOR AND PROCESS FOR ITS USE
Publication number
20150217252
Publication date
Aug 6, 2015
HEMLOCK SEMICONDUCTOR CORPORATION
John V. Bucci
G01 - MEASURING TESTING