John W. Hadd

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Saginaw, MI, US

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Patents Grantslast 30 patents

Information Patent Grant
Method of determining a concentration of a material not dissolved b...
- Patent number 10,345,211
- Issue date Jul 9, 2019
- HEMLOCK SEMICONDUCTOR OPERATIONS LLC
- John W. Hadd
- C01 - INORGANIC CHEMISTRY
Information Patent Grant
Applying edge-on photoluminescence to measure bulk impurities of se...
- Patent number 9,261,464
- Issue date Feb 16, 2016
- Hemlock Semiconductor Corporation
- Doug Kreszowski
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD OF DETERMINING A CONCENTRATION OF A MATERIAL NOT DISSOLVED B...
- Publication number 20170276582
- Publication date Sep 28, 2017
- HEMLOCK SEMICONDUCTOR CORPORATION
- John W. Hadd
- G01 - MEASURING TESTING
Information Patent Application
APPLYING EDGE-ON PHOTOLUMINESCENCE TO MEASURE BULK IMPURITIES OF SE...
- Publication number 20130075627
- Publication date Mar 28, 2013
- HEMLOCK SEMICONDUCTOR CORPORATION
- Doug Kreszowski
- G01 - MEASURING TESTING
Information Patent Application
Method Of Analyzing A Composition Containing Impurities
- Publication number 20110228268
- Publication date Sep 22, 2011
- John Hadd
- G01 - MEASURING TESTING