John W. Schultz

Person

Alpharetta, GA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Flat lens antenna
- Patent number 11,973,270
- Issue date Apr 30, 2024
- COMPASS TECHNOLOGY GROUP LLC
- John W. Schultz
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Microwave dielectric analyzer
- Patent number 11,467,102
- Issue date Oct 11, 2022
- COMPASS TECHNOLOGY GROUP LLC
- John Weber Schultz
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Fragmented aperture antennas
- Patent number 11,228,102
- Issue date Jan 18, 2022
- James Geoffrey Maloney
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Correction of transmission line induced phase and amplitude errors...
- Patent number 11,215,655
- Issue date Jan 4, 2022
- Compass Technology Group, LLC
- John Weber Schultz
- G01 - MEASURING TESTING
Information Patent Grant
Fragmented aperture antennas
- Patent number 10,658,738
- Issue date May 19, 2020
- James Geoffrey Maloney
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Non-contact determination of coating thickness
- Patent number 10,203,202
- Issue date Feb 12, 2019
- John Weber Schultz
- G01 - MEASURING TESTING
Information Patent Grant
Low diffuse scatter, anechoic chamber absorber
- Patent number 10,048,301
- Issue date Aug 14, 2018
- Kathleen C Maloney
- G01 - MEASURING TESTING
Information Patent Grant
Traveling wave spot probe
- Patent number 9,995,694
- Issue date Jun 12, 2018
- John W. Schultz
- G01 - MEASURING TESTING
Information Patent Grant
Method for making a low diffuse scatter, anechoic chamber absorber
- Patent number 9,459,299
- Issue date Oct 4, 2016
- Kathleen C Maloney
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
MICROWAVE DIELECTRIC ANALYZER
- Publication number 20230036023
- Publication date Feb 2, 2023
- Compass Technology Group, LLC
- John Weber Schultz
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
Flat Lens Antenna
- Publication number 20220278459
- Publication date Sep 1, 2022
- Compass Technology Group, LLC
- John W. Schultz
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CORRECTION OF TRANSMISSION LINE INDUCED PHASE AND AMPLITUDE ERRORS...
- Publication number 20220120798
- Publication date Apr 21, 2022
- Compass Technology Group LLC
- John Weber Schultz
- G01 - MEASURING TESTING
Information Patent Application
FRAGMENTED APERTURE ANTENNAS
- Publication number 20200350666
- Publication date Nov 5, 2020
- Compass Technology Group LLC
- James Geoffrey Maloney
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MICROWAVE DIELECTRIC ANALYZER
- Publication number 20200025694
- Publication date Jan 23, 2020
- John Weber Schultz
- G01 - MEASURING TESTING
Information Patent Application
FRAGMENTED APERTURE ANTENNAS
- Publication number 20170047650
- Publication date Feb 16, 2017
- James Geoffrey Maloney
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
LOW DIFFUSE SCATTER, ANECHOIC CHAMBER ABSORBER
- Publication number 20160356833
- Publication date Dec 8, 2016
- Kathleen C. Maloney
- G01 - MEASURING TESTING
Information Patent Application
CORRECTION OF TRANSMISSION LINE INDUCED PHASE AND AMPLITUDE ERRORS...
- Publication number 20160103197
- Publication date Apr 14, 2016
- John Weber Schultz
- G01 - MEASURING TESTING
Information Patent Application
Non-Contact Determination of Coating Thickness
- Publication number 20150285621
- Publication date Oct 8, 2015
- John Weber Schultz
- G01 - MEASURING TESTING
Information Patent Application
TRAVELING WAVE SPOT PROBE
- Publication number 20140300373
- Publication date Oct 9, 2014
- John W. Schultz
- G01 - MEASURING TESTING
Information Patent Application
LOW DIFFUSE SCATTER, ANECHOIC CHAMBER ABSORBER
- Publication number 20140259639
- Publication date Sep 18, 2014
- Kathleen C. Maloney
- G01 - MEASURING TESTING

John W. Schultz

Person

Patents Grantslast 30 patents

Flat lens antenna

Microwave dielectric analyzer

Fragmented aperture antennas

Correction of transmission line induced phase and amplitude errors...

Fragmented aperture antennas

Non-contact determination of coating thickness

Low diffuse scatter, anechoic chamber absorber

Traveling wave spot probe

Method for making a low diffuse scatter, anechoic chamber absorber

Patents Applicationslast 30 patents

MICROWAVE DIELECTRIC ANALYZER

Flat Lens Antenna

CORRECTION OF TRANSMISSION LINE INDUCED PHASE AND AMPLITUDE ERRORS...

FRAGMENTED APERTURE ANTENNAS

MICROWAVE DIELECTRIC ANALYZER

FRAGMENTED APERTURE ANTENNAS

LOW DIFFUSE SCATTER, ANECHOIC CHAMBER ABSORBER

CORRECTION OF TRANSMISSION LINE INDUCED PHASE AND AMPLITUDE ERRORS...

Non-Contact Determination of Coating Thickness

TRAVELING WAVE SPOT PROBE

LOW DIFFUSE SCATTER, ANECHOIC CHAMBER ABSORBER