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John W. Simpson
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Yorktown, VA, US
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Patents Grants
last 30 patents
Information
Patent Grant
Eddy current probe for surface and sub-surface inspection
Patent number
8,717,012
Issue date
May 6, 2014
The United States of America as respresented by the United States National Ae...
Russell A. Wincheski
G01 - MEASURING TESTING
Information
Patent Grant
Eddy current system and method for crack detection
Patent number
8,164,328
Issue date
Apr 24, 2012
The United States of America as represented by the administrator of the Natio...
Russell A. Wincheski
G01 - MEASURING TESTING
Information
Patent Grant
Magnetoresistive flux focusing eddy current flaw detection
Patent number
6,888,346
Issue date
May 3, 2005
The United States of America as represented by the administrator of the Natio...
Russell A. Wincheski
G01 - MEASURING TESTING
Information
Patent Grant
Radially focused eddy current sensor for detection of longitudinal...
Patent number
5,942,894
Issue date
Aug 24, 1999
The United States of America as represented by the administrator of the Natio...
Russell A. Wincheski
G01 - MEASURING TESTING
Information
Patent Grant
Thickness gauging of single-layer conductive materials with two-poi...
Patent number
5,847,562
Issue date
Dec 8, 1998
The United States of America as represented by the administrator of the Natio...
James P. Fulton
G01 - MEASURING TESTING
Information
Patent Grant
Eddy current method for fatigue testing
Patent number
5,698,977
Issue date
Dec 16, 1997
The United States of America as represented by the administrator of the Natio...
John W. Simpson
G01 - MEASURING TESTING
Information
Patent Grant
Rotating flux-focusing eddy current probe for flaw detection
Patent number
5,648,721
Issue date
Jul 15, 1997
The United States of America as represented by the administrator of the Natio...
Russell A. Wincheski
G01 - MEASURING TESTING
Information
Patent Grant
Flux focusing eddy current probe
Patent number
5,617,024
Issue date
Apr 1, 1997
The United States of America as represented by the United States National Aer...
John W. Simpson
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
Eddy Current Probe for Surface and Sub-Surface Inspection
Publication number
20120274319
Publication date
Nov 1, 2012
USA as represented by the Administrator of the National Aeronautics and Space...
Russell A. Wincheski
G01 - MEASURING TESTING
Information
Patent Application
Eddy Current System and Method for Crack Detection
Publication number
20100079157
Publication date
Apr 1, 2010
United States of America as represented by the Administrator of the National...
Russell A. Wincheski
G01 - MEASURING TESTING
Information
Patent Application
Magnetoresistive flux focusing eddy current flaw detection
Publication number
20020130659
Publication date
Sep 19, 2002
National Aeronautics & Space Administration
Russell A. Wincheski
G01 - MEASURING TESTING