John W. Tarzwell

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Phoenix, AZ, US

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Patents Grantslast 30 patents

Information Patent Grant
Probe system for device and circuit testing
- Patent number 5,066,907
- Issue date Nov 19, 1991
- Cerprobe Corporation
- John W. Tarzwell
- G01 - MEASURING TESTING
Information Patent Grant
Probe device for integrated circuit wafers
- Patent number 4,161,692
- Issue date Jul 17, 1979
- Cerprobe Corporation
- John W. Tarzwell
- G01 - MEASURING TESTING