John Wall

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Newton Aycliffe, GB

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Patents Grantslast 30 patents

Information Patent Grant
X-ray tube
- Patent number 11,302,508
- Issue date Apr 12, 2022
- BRUKER TECHNOLOGIES LTD.
- Alexander Krokhmal
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Image contrast in X-ray topography imaging for defect inspection
- Patent number 10,816,487
- Issue date Oct 27, 2020
- BRUKER TECHNOLOGIES LTD.
- Kevin Monroe Matney
- G01 - MEASURING TESTING
Information Patent Grant
Using multiple sources/detectors for high-throughput X-ray topograp...
- Patent number 9,726,624
- Issue date Aug 8, 2017
- BRUKER JV ISRAEL LTD.
- Paul Anthony Ryan
- G01 - MEASURING TESTING
Information Patent Grant
X-ray beam conditioning
- Patent number 9,269,468
- Issue date Feb 23, 2016
- Jordan Valley Semiconductors Ltd.
- Paul Anthony Ryan
- G01 - MEASURING TESTING
Information Patent Grant
Detection of wafer-edge defects
- Patent number 8,781,070
- Issue date Jul 15, 2014
- Jordan Valley Semiconductors Ltd.
- Matthew Wormington
- G01 - MEASURING TESTING
Information Patent Grant
Fast measurement of X-ray diffraction from tilted layers
- Patent number 8,437,450
- Issue date May 7, 2013
- Jordan Valley Semiconductors Ltd.
- John Wall
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for prolonging the life of an X-ray target
- Patent number 6,778,633
- Issue date Aug 17, 2004
- Bede Scientific Instruments Limited
- Neil Loxley
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR

Patents Applicationslast 30 patents

Information Patent Application
X-RAY TUBE
- Publication number 20200168427
- Publication date May 28, 2020
- Alexander Krokhmal
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Image contrast in X-Ray topography imaging for defect inspection
- Publication number 20190317028
- Publication date Oct 17, 2019
- BRUKER JV ISRAEL LTD.
- Kevin Monroe Matney
- G01 - MEASURING TESTING
Information Patent Application
USING MULTIPLE SOURCES/DETECTORS FOR HIGH-THROUGHPUT X-RAY TOPOGRAP...
- Publication number 20150369761
- Publication date Dec 24, 2015
- JORDAN VALLEY SEMICONDUCTORS LTD.
- Paul Anthony Ryan
- G01 - MEASURING TESTING
Information Patent Application
X-RAY BEAM CONDITIONING
- Publication number 20130287178
- Publication date Oct 31, 2013
- JORDAN VALLEY SEMICONDUCTORS LTD.
- Paul Anthony Ryan
- G01 - MEASURING TESTING
Information Patent Application
Detection of Wafer-Edge Defects
- Publication number 20130039471
- Publication date Feb 14, 2013
- JORDAN VALLEY SEMICONDUCTORS LTD.
- Matthew Wormington
- G01 - MEASURING TESTING
Information Patent Application
FAST MEASUREMENT OF X-RAY DIFFRACTION FROM TILTED LAYERS
- Publication number 20120140889
- Publication date Jun 7, 2012
- JORDAN VALLEY SEMICONDUCTORS LTD.
- John Wall
- G01 - MEASURING TESTING