John Warwick Silzel

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Yorba Linda, CA, US

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Patents Applicationslast 30 patents

Information Patent Application
METHODS AND SYSTEMS FOR CORRECTING BIAS
- Publication number 20250198910
- Publication date Jun 19, 2025
- DH Technologies Development Pte. Ltd.
- John W. Silzel
- G01 - MEASURING TESTING
Information Patent Application
Native Fluorescence Detection for Protein Analysis in Capillary Ele...
- Publication number 20240201131
- Publication date Jun 20, 2024
- DH Technologies Development Pte. Ltd.
- Sunil DELIWALA
- G01 - MEASURING TESTING
Information Patent Application
Method for Extracting cIEF-MS Profiles from m/z versus Time Arrays
- Publication number 20230307220
- Publication date Sep 28, 2023
- DH Technologies Development Pte. Ltd.
- John Warwick Silzel
- H01 - BASIC ELECTRIC ELEMENTS