John William Ertel

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New Vienna, OH, US

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Patents Grantslast 30 patents

Information Patent Grant
Methods and apparatus for testing a component
- Patent number 8,013,599
- Issue date Sep 6, 2011
- General Electric Company
- Ui Won Suh
- G01 - MEASURING TESTING
Information Patent Grant
Methods and apparatus for testing a component
- Patent number 7,436,992
- Issue date Oct 14, 2008
- General Electric Company
- Ui Won Suh
- G01 - MEASURING TESTING
Information Patent Grant
Molded eddy current array probe
- Patent number 6,812,697
- Issue date Nov 2, 2004
- General Electric Company
- William Stewart McKnight
- G01 - MEASURING TESTING
Information Patent Grant
Eddy current calibration standard
- Patent number 6,356,069
- Issue date Mar 12, 2002
- General Electric Company
- Richard L. Trantow
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
EDDY CURRENT ARRAY PROBES WITH ENHANCED DRIVE FIELDS
- Publication number 20070222439
- Publication date Sep 27, 2007
- GENERAL ELECTRIC COMPANY
- Changting Wang
- G01 - MEASURING TESTING
Information Patent Application
Eddy current array probes with enhanced drive fields
- Publication number 20060132123
- Publication date Jun 22, 2006
- General Electric Company
- Changting Wang
- G01 - MEASURING TESTING
Information Patent Application
Methods and apparatus for testing a component
- Publication number 20060109001
- Publication date May 25, 2006
- Ui Won Suh
- G01 - MEASURING TESTING
Information Patent Application
Methods and apparatus for testing a component
- Publication number 20060023961
- Publication date Feb 2, 2006
- Ui Won Suh
- G01 - MEASURING TESTING
Information Patent Application
Molded eddy current array probe
- Publication number 20040056656
- Publication date Mar 25, 2004
- General Electric Company
- William Stewart McKnight
- G01 - MEASURING TESTING