John William Kostenko

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LaGrangeville, NY, US

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Patents Grantslast 30 patents

Information Patent Grant
Method for monitoring status of system components
- Patent number 8,460,945
- Issue date Jun 11, 2013
- Tokyo Electron Limited
- David L. O'Meara
- G01 - MEASURING TESTING
Information Patent Grant
Method and processing system for monitoring status of system compon...
- Patent number 7,479,454
- Issue date Jan 20, 2009
- Tokyo Electron Limited
- David L. O'Meara
- B81 - MICRO-STRUCTURAL TECHNOLOGY

Patents Applicationslast 30 patents

Information Patent Application
Method and processing system for plasma-enhanced cleaning of system...
- Publication number 20050211264
- Publication date Sep 29, 2005
- Tokyo Electron Limited of TBS Broadcast Center
- John William Kostenko
- B08 - CLEANING
Information Patent Application
Method and processing system for monitoring status of system compon...
- Publication number 20050070104
- Publication date Mar 31, 2005
- TOKYO ELECTRON LIMITED
- David L. O'Meara
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
Method for monitoring status of system components
- Publication number 20050068519
- Publication date Mar 31, 2005
- TOKYO ELECTRON LIMITED
- David L. O'Meara
- G01 - MEASURING TESTING