John Z. Colt JR.

Person

Williston, VT, US

People

Patents Grantslast 30 patents

Information Patent Grant
Use of multivariate models to control manufacturing operations
- Patent number 10,228,685
- Issue date Mar 12, 2019
- GLOBALFOUNDRIES Inc.
- John Z. Colt
- G05 - CONTROLLING REGULATING
Information Patent Grant
Lateral silicon-on-insulator bipolar junction transistor process an...
- Patent number 9,397,203
- Issue date Jul 19, 2016
- GLOBALFOUNDRIES Inc.
- John Z. Colt
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Lateral silicon-on-insulator bipolar junction transistor process an...
- Patent number 9,059,230
- Issue date Jun 16, 2015
- International Business Machines Corporation
- John Z. Colt
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Wafer identification mark
- Patent number 7,510,124
- Issue date Mar 31, 2009
- International Business Machines Corporation
- Brian Barker
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
User configurable multivariate time series reduction tool control m...
- Patent number 6,678,569
- Issue date Jan 13, 2004
- International Business Machines Corporation
- Raymond J. Bunkofske
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
User configurable multivariate time series reduction tool control m...
- Patent number 6,584,368
- Issue date Jun 24, 2003
- International Business Machines Corporation
- Raymond J. Bunkofske
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
User configurable multivariate time series reduction tool control m...
- Patent number 6,442,445
- Issue date Aug 27, 2002
- International Business Machines Corporation,
- Raymond J. Bunkofske
- G05 - CONTROLLING REGULATING
Information Patent Grant
Double silicon-on-insulator device and method thereof
- Patent number 6,383,892
- Issue date May 7, 2002
- International Business Machines Corporation
- John Z. Colt
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Double silicon-on-insulator device and method therefor
- Patent number 6,013,936
- Issue date Jan 11, 2000
- International Business Machines Corporation
- John Z. Colt
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Use of Multivariate Models to Control Manufacturing Operations
- Publication number 20170115658
- Publication date Apr 27, 2017
- GLOBALFOUNDRIES INC.
- John Z. Colt
- G05 - CONTROLLING REGULATING
Information Patent Application
LATERAL SILICON-ON-INSULATOR BIPOLAR JUNCTION TRANSISTOR PROCESS AN...
- Publication number 20150214346
- Publication date Jul 30, 2015
- International Business Machines Corporation
- John Z. Colt
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
WAFER IDENTIFICATION MARK
- Publication number 20070241202
- Publication date Oct 18, 2007
- International Business Machines Corporation
- Brian C. Barker
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
User configurable multivariate time series reduction tool control m...
- Publication number 20030055523
- Publication date Mar 20, 2003
- Raymond J. Bunkofske
- G05 - CONTROLLING REGULATING
Information Patent Application
User configurable multivariate time series reduction tool control m...
- Publication number 20020062162
- Publication date May 23, 2002
- Raymond J. Bunkofske
- G05 - CONTROLLING REGULATING

John Z. Colt JR.

Person

Patents Grantslast 30 patents

Use of multivariate models to control manufacturing operations

Lateral silicon-on-insulator bipolar junction transistor process an...

Lateral silicon-on-insulator bipolar junction transistor process an...

Wafer identification mark

User configurable multivariate time series reduction tool control m...

User configurable multivariate time series reduction tool control m...

User configurable multivariate time series reduction tool control m...

Double silicon-on-insulator device and method thereof

Double silicon-on-insulator device and method therefor

Patents Applicationslast 30 patents

Use of Multivariate Models to Control Manufacturing Operations

LATERAL SILICON-ON-INSULATOR BIPOLAR JUNCTION TRANSISTOR PROCESS AN...

WAFER IDENTIFICATION MARK

User configurable multivariate time series reduction tool control m...

User configurable multivariate time series reduction tool control m...