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Johnathan R.W. Ammerman
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Austin, TX, US
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Patents Grants
last 30 patents
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Patent Grant
Arbitrary waveform generator with configurable digital signal proce...
Patent number
7,340,357
Issue date
Mar 4, 2008
National Instruments Corporation
Johnathan R. W. Ammerman
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
Arbitrary waveform generator with configurable digital signal proce...
Publication number
20060271317
Publication date
Nov 30, 2006
Johnathan R.W. Ammerman
G01 - MEASURING TESTING