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Joji Kayano

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  • Wakayama, JP
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Patents Grantslast 30 patents

  • Information Patent Grant

    Integral value measuring circuit
    • Patent number 8,829,972
    • Issue date Sep 9, 2014
    • Hanwa Electronic Ind. Co., Ltd.
    • Toshiyuki Nakaie
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents

  • Information Patent Application

    Integral Value Measuring Circuit
    • Publication number 20130009628
    • Publication date Jan 10, 2013
    • HANWA ELECTRONIC IND. CO., LTD.
    • Toshiyuki Nakaie
    • G01 - MEASURING TESTING