Jon C. Sandberg

Person

Boulder, CO, US

People

Patents Grantslast 30 patents

Information Patent Grant
Two-dimensional optical imaging methods and systems for particle de...
- Patent number 8,427,642
- Issue date Apr 23, 2013
- Particle Measuring Systems, Inc.
- John Mitchell
- G01 - MEASURING TESTING
Information Patent Grant
Non-orthogonal particle detection systems and methods
- Patent number 8,174,697
- Issue date May 8, 2012
- Particle Measuring Systems, Inc.
- John Mitchell
- G01 - MEASURING TESTING
Information Patent Grant
Two-dimensional optical imaging methods and systems for particle de...
- Patent number 8,154,724
- Issue date Apr 10, 2012
- Particle Measuring Systems, Inc.
- John Mitchell
- G01 - MEASURING TESTING
Information Patent Grant
Non-orthogonal particle detection systems and methods
- Patent number 8,027,035
- Issue date Sep 27, 2011
- Particle Measuring Systems, Inc.
- John Mitchell
- G01 - MEASURING TESTING
Information Patent Grant
Non-orthogonal particle detection systems and methods
- Patent number 7,916,293
- Issue date Mar 29, 2011
- Particle Measuring Systems, Inc.
- John Mitchell
- G01 - MEASURING TESTING
Information Patent Grant
Method for noise cancellation by spectral flattening of laser outpu...
- Patent number 7,295,585
- Issue date Nov 13, 2007
- Research Electro-Optics, Inc.
- Jon C. Sandberg
- G01 - MEASURING TESTING
Information Patent Grant
Method of noise cancellation in an unpolarized-laser instrument
- Patent number 7,079,243
- Issue date Jul 18, 2006
- Research Electro-Optics, Inc.
- Jon C. Sandberg
- G01 - MEASURING TESTING
Information Patent Grant
Beam array pitch controller
- Patent number 7,023,620
- Issue date Apr 4, 2006
- Research Electro-Optics, Inc.
- Jon C. Sandberg
- G02 - OPTICS
Information Patent Grant
Method and apparatus for achieving polarization in a laser using a...
- Patent number 6,567,456
- Issue date May 20, 2003
- Research Electro-Optics, Inc.
- Jon C. Sandberg
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High-precision etalon device and method of construction
- Patent number 6,379,984
- Issue date Apr 30, 2002
- Research Electro-Optics, Inc.
- Jon C. Sandberg
- G02 - OPTICS
Information Patent Grant
Small particle characteristic determination
- Patent number 5,920,388
- Issue date Jul 6, 1999
- Research Electro-Optics, Inc.
- Jon C. Sandberg
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for minimizing performance degradation in a la...
- Patent number 5,907,575
- Issue date May 25, 1999
- Research Electro-Optics, Inc.
- Jon C. Sandberg
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Intracavity particle detection using optically pumped laser media
- Patent number 5,889,589
- Issue date Mar 30, 1999
- Research Electro-Optics, Inc.
- Jon C. Sandberg
- G01 - MEASURING TESTING
Information Patent Grant
Intracavity particle detection using optically pumped laser media
- Patent number 5,726,753
- Issue date Mar 10, 1998
- Research Electro-Optics, Inc.
- Jon C. Sandberg
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Two-Dimensional Optical Imaging Methods and Systems for Particle De...
- Publication number 20120140223
- Publication date Jun 7, 2012
- Particle Measuring Systems, Inc.
- John MITCHELL
- G01 - MEASURING TESTING
Information Patent Application
Non-Orthogonal Particle Detection Systems and Methods
- Publication number 20120012757
- Publication date Jan 19, 2012
- Particle Measuring Systems, Inc.
- John MITCHELL
- G01 - MEASURING TESTING
Information Patent Application
Non-Orthogonal Particle Detection Systems and Methods
- Publication number 20110155927
- Publication date Jun 30, 2011
- Particle Measuring Systems, Inc.
- John MITCHELL
- G01 - MEASURING TESTING
Information Patent Application
TWO-DIMENSIONAL OPTICAL IMAGING METHODS AND SYSTEMS FOR PARTICLE DE...
- Publication number 20090244536
- Publication date Oct 1, 2009
- John Mitchell
- G01 - MEASURING TESTING
Information Patent Application
NON-ORTHOGONAL PARTICLE DETECTION SYSTEMS AND METHODS
- Publication number 20090219530
- Publication date Sep 3, 2009
- John Mitchell
- G01 - MEASURING TESTING
Information Patent Application
Method for noise cancellation by spectral flattening of laser outpu...
- Publication number 20040051869
- Publication date Mar 18, 2004
- Jon C. Sandberg
- G01 - MEASURING TESTING
Information Patent Application
Method of noise cancellation in an unpolarized-laser instrument
- Publication number 20040051870
- Publication date Mar 18, 2004
- Jon C. Sandberg
- G01 - MEASURING TESTING

Jon C. Sandberg

Person

Patents Grantslast 30 patents

Two-dimensional optical imaging methods and systems for particle de...

Non-orthogonal particle detection systems and methods

Two-dimensional optical imaging methods and systems for particle de...

Non-orthogonal particle detection systems and methods

Non-orthogonal particle detection systems and methods

Method for noise cancellation by spectral flattening of laser outpu...

Method of noise cancellation in an unpolarized-laser instrument

Beam array pitch controller

Method and apparatus for achieving polarization in a laser using a...

High-precision etalon device and method of construction

Small particle characteristic determination

Apparatus and method for minimizing performance degradation in a la...

Intracavity particle detection using optically pumped laser media

Intracavity particle detection using optically pumped laser media

Patents Applicationslast 30 patents

Two-Dimensional Optical Imaging Methods and Systems for Particle De...

Non-Orthogonal Particle Detection Systems and Methods

Non-Orthogonal Particle Detection Systems and Methods

TWO-DIMENSIONAL OPTICAL IMAGING METHODS AND SYSTEMS FOR PARTICLE DE...

NON-ORTHOGONAL PARTICLE DETECTION SYSTEMS AND METHODS

Method for noise cancellation by spectral flattening of laser outpu...

Method of noise cancellation in an unpolarized-laser instrument