Jon Karl Weiss

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Tempe, AZ, US

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Patents Grantslast 30 patents

Information Patent Grant
Method for automatically aligning a scanning transmission electron...
- Patent number 10,811,216
- Issue date Oct 20, 2020
- TESCAN BRNO s.r.o
- Stanislav Petras
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scanning transmission electron microscope
- Patent number 10,636,622
- Issue date Apr 28, 2020
- Tescan Orsay Holding, A.S.
- Petras Stanislav
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and system for improving characteristic peak signals in anal...
- Patent number 9,406,496
- Issue date Aug 2, 2016
- Universitat de Barcelona
- Sonia Estrade Albiol
- G01 - MEASURING TESTING
Information Patent Grant
System and process for measuring strain in materials at high spatia...
- Patent number 9,274,070
- Issue date Mar 1, 2016
- APPFIVE, LLC
- Jon Karl Weiss
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD FOR AUTOMATICALLY ALIGNING A SCANNING TRANSMISSION ELECTRON...
- Publication number 20190295810
- Publication date Sep 26, 2019
- TESCAN BRNO s.r.o.
- Stanislav Petras
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Scanning Transmission Electron Microscope
- Publication number 20180269031
- Publication date Sep 20, 2018
- TESCAN Brno, s.r.o.
- Petras Stanislav
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEM AND PROCESS FOR MEASURING STRAIN IN MATERIALS AT HIGH SPATIA...
- Publication number 20150076346
- Publication date Mar 19, 2015
- Jon Karl Weiss
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR IMPROVING CHARACTERISTIC PEAK SIGNALS IN ANAL...
- Publication number 20130240728
- Publication date Sep 19, 2013
- Universitat De Barcelona
- Sonia Estrade Albiol
- G01 - MEASURING TESTING