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Jon R. Phillips
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Richland, WA, US
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last 30 patents
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Patent Grant
System and method for high precision isotope ratio destructive anal...
Patent number
8,477,304
Issue date
Jul 2, 2013
Battelle Memorial Institute
Bruce A. Bushaw
G01 - MEASURING TESTING
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last 30 patents
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Patent Application
SYSTEM AND METHOD FOR HIGH PRECISION ISOTOPE RATIO DESTRUCTIVE ANAL...
Publication number
20110164248
Publication date
Jul 7, 2011
Battelle Memorial Institute
Bruce A. Bushaw
G01 - MEASURING TESTING