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Jon Tower
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Indialantic, FL, US
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last 30 patents
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Patent Grant
Systems and methods for measuring geometric changes of embedded pas...
Patent number
8,427,652
Issue date
Apr 23, 2013
Harris Corporation
Lendon L. Bendix
G01 - MEASURING TESTING
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last 30 patents
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Patent Application
SYSTEMS AND METHODS FOR MEASURING GEOMETRIC CHANGES OF EMBEDDED PAS...
Publication number
20110164256
Publication date
Jul 7, 2011
Harris Corporation
Lendon L. Bendix
G01 - MEASURING TESTING