Membership
Tour
Register
Log in
Jonathan A. Levi
Follow
Person
Fallbrook, CA, US
People
Overview
Industries
Organizations
People
Information
Impact
Patents Grants
last 30 patents
Information
Patent Grant
Digital BIST test scheme for ADC/DAC circuits
Patent number
7,271,751
Issue date
Sep 18, 2007
Toshiba America Electronic Components, Inc.
LuVerne Peterson
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Test wafer for diagnosing flaws in an integrated circuit fabricatio...
Patent number
5,266,890
Issue date
Nov 30, 1993
Unisys Corporation
Cevat Kumbasar
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Fast change standard cell digital logic chip
Patent number
5,214,299
Issue date
May 25, 1993
Unisys Corporation
Laszlo V. Gal
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
DIGITAL BIST TEST SCHEME FOR ADC/DAC CIRCUITS
Publication number
20070182612
Publication date
Aug 9, 2007
Toshiba America Electronic Components, Inc.
LuVerne Peterson
H03 - BASIC ELECTRONIC CIRCUITRY