Jonathan B. Buckheit

Person

Los Altos, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Semiconductor yield management system and method
- Patent number 8,380,472
- Issue date Feb 19, 2013
- Rudolph Technologies, Inc.
- Weidong Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Bitmap cluster analysis of defects in integrated circuits
- Patent number 8,190,952
- Issue date May 29, 2012
- Rudolph Technologies, Inc.
- Tom T. Ho
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor yield management system and method
- Patent number RE42481
- Issue date Jun 21, 2011
- Rudolph Technologies, Inc.
- Weidong Wang
- 700 - Data processing: generic control systems or specific applications
Information Patent Grant
Analysis techniques for multi-level memory
- Patent number 7,954,018
- Issue date May 31, 2011
- Rudolph Technologies, Inc.
- Tom T. Ho
- G11 - INFORMATION STORAGE
Information Patent Grant
Bitmap cluster analysis of defects in integrated circuits
- Patent number 7,685,481
- Issue date Mar 23, 2010
- MKS Instruments, Inc.
- Tom T. Ho
- G11 - INFORMATION STORAGE
Information Patent Grant
System and method for analyzing error information from a semiconduc...
- Patent number 6,768,961
- Issue date Jul 27, 2004
- Yield Dyamics, Inc.
- Jonathan B. Buckheit
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor yield management system and method
- Patent number 6,470,229
- Issue date Oct 22, 2002
- Yield Dynamics, Inc.
- Weidong Wang
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
BITMAP CLUSTER ANALYSIS OF DEFECTS IN INTEGRATED CIRCUITS
- Publication number 20100235690
- Publication date Sep 16, 2010
- MKS Instruments, Inc.
- Tom T. Ho
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor yield management system and method
- Publication number 20080281566
- Publication date Nov 13, 2008
- Weidong Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Analysis techniques for multi-level memory
- Publication number 20080189582
- Publication date Aug 7, 2008
- Yield Dynamics, Inc.
- Tom T. Ho
- G11 - INFORMATION STORAGE
Information Patent Application
Bitmap cluster analysis of defects in integrated circuits
- Publication number 20070011509
- Publication date Jan 11, 2007
- Tom T. Ho
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor yield management system and method
- Publication number 20060095237
- Publication date May 4, 2006
- Weidong Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
System and method for analyzing error information from a semiconduc...
- Publication number 20030055592
- Publication date Mar 20, 2003
- Jonathan B. Buckheit
- G01 - MEASURING TESTING

Jonathan B. Buckheit

Person

Patents Grantslast 30 patents

Semiconductor yield management system and method

Bitmap cluster analysis of defects in integrated circuits

Semiconductor yield management system and method

Analysis techniques for multi-level memory

Bitmap cluster analysis of defects in integrated circuits

System and method for analyzing error information from a semiconduc...

Semiconductor yield management system and method

Patents Applicationslast 30 patents

BITMAP CLUSTER ANALYSIS OF DEFECTS IN INTEGRATED CIRCUITS

Semiconductor yield management system and method

Analysis techniques for multi-level memory

Bitmap cluster analysis of defects in integrated circuits

Semiconductor yield management system and method

System and method for analyzing error information from a semiconduc...