Jonathan Cheang-Whang Chang

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Mountain View, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
In-line reliability test using E-beam scan
- Patent number 7,635,843
- Issue date Dec 22, 2009
- Xilinx, Inc.
- Yuhao Luo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of directionally trimming polysilicon width
- Patent number 7,091,077
- Issue date Aug 15, 2006
- Xilinx, Inc.
- David Kuan-Yu Liu
- H01 - BASIC ELECTRIC ELEMENTS