Jonathan Francis Van Dyke

Person

Baltimore, MD, US

People

Patents Grantslast 30 patents

Information Patent Grant
Cryogenic wafer test system
- Patent number 11,693,047
- Issue date Jul 4, 2023
- Northrop Grumman Systems Corporation
- Tessandra Anne Sage
- G01 - MEASURING TESTING
Information Patent Grant
Planar ring radiation barrier for cryogenic wafer test system
- Patent number 11,639,957
- Issue date May 2, 2023
- Northrop Grumman Systems Corporation
- Kelsey McCusker
- G01 - MEASURING TESTING
Information Patent Grant
Superconducting flexible interconnecting cable connector
- Patent number 11,380,461
- Issue date Jul 5, 2022
- Northrop Grumman Systems Corporation
- Jonathan Francis Van Dyke
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Support structure for a flexible interconnect of a superconductor
- Patent number 11,032,935
- Issue date Jun 8, 2021
- Northrop Grumman Systems Corporation
- Martin Brokner Christiansen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Temperature control method, system, and apparatus
- Patent number 10,575,437
- Issue date Feb 25, 2020
- Northrop Grumman Systems Corporation
- Martin Brokner Christiansen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Cryogenic computing system with thermal management using a metal pr...
- Patent number 10,394,292
- Issue date Aug 27, 2019
- Microsoft Technology Licensing, LLC
- Jonathan F. Van Dyke
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Device and method for providing immersion cooling in a compact-form...
- Patent number 10,165,707
- Issue date Dec 25, 2018
- Northrop Grumman Systems Corporation
- Martin Brokner Christiansen
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR

Patents Applicationslast 30 patents

Information Patent Application
CRYOGENIC WAFER TEST SYSTEM
- Publication number 20230003788
- Publication date Jan 5, 2023
- Northrop Grumman Systems Corporation
- TESSANDRA ANNE SAGE
- G01 - MEASURING TESTING
Information Patent Application
RADIATION BARRIER FOR CRYOGENIC WAFER TEST SYSTEM
- Publication number 20230003791
- Publication date Jan 5, 2023
- Northrop Grumman Systems Corporation
- KELSEY McCUSKER
- G01 - MEASURING TESTING
Information Patent Application
SUPPORT STRUCTURE FOR A FLEXIBLE INTERCONNECT OF A SUPEROCNDUCTOR
- Publication number 20210176890
- Publication date Jun 10, 2021
- Northrop Grumman Systems Corporation
- MARTIN BROKNER CHRISTIANSEN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SUPERCONDUCTING FLEXIBLE INTERCONNECTING CABLE CONNECTOR
- Publication number 20210005353
- Publication date Jan 7, 2021
- Northrop Grumman Systems Corporation
- JONATHAN FRANCIS VAN DYKE
- H01 - BASIC ELECTRIC ELEMENTS

Jonathan Francis Van Dyke

Person

Patents Grantslast 30 patents

Cryogenic wafer test system

Planar ring radiation barrier for cryogenic wafer test system

Superconducting flexible interconnecting cable connector

Support structure for a flexible interconnect of a superconductor

Temperature control method, system, and apparatus

Cryogenic computing system with thermal management using a metal pr...

Device and method for providing immersion cooling in a compact-form...

Patents Applicationslast 30 patents

CRYOGENIC WAFER TEST SYSTEM

RADIATION BARRIER FOR CRYOGENIC WAFER TEST SYSTEM

SUPPORT STRUCTURE FOR A FLEXIBLE INTERCONNECT OF A SUPEROCNDUCTOR

SUPERCONDUCTING FLEXIBLE INTERCONNECTING CABLE CONNECTOR