Jonathan H. Orloff

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Rockaway Beach, OR, US

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Patents Grantslast 30 patents

Information Patent Grant
Charged particle detector
- Patent number 8,907,305
- Issue date Dec 9, 2014
- FEI Company
- Eric Kneedler
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Focused charged particle column for operation at different beam ene...
- Patent number 8,742,361
- Issue date Jun 3, 2014
- FEI Company
- Mostafa Maazouz
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Distributed ion source acceleration column
- Patent number 8,314,404
- Issue date Nov 20, 2012
- FEI Company
- Jabez McClelland
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Beam quality in FIB systems
- Patent number 8,053,725
- Issue date Nov 8, 2011
- FEI Company
- Gregory A. Schwind
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Focused Charged Particle Column for Operation at Different Beam Ene...
- Publication number 20130327952
- Publication date Dec 12, 2013
- FEI Company
- Mostafa Maazouz
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE DETECTOR
- Publication number 20130214156
- Publication date Aug 22, 2013
- FEI Company
- Eric Kneedler
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Distributed Ion Source Acceleration Column
- Publication number 20110210264
- Publication date Sep 1, 2011
- FEI Company
- Jabez J. McClelland
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
BEAM QUALITY IN FIB SYSTEMS
- Publication number 20100327180
- Publication date Dec 30, 2010
- FEI Company
- Gregory A. Schwind
- H01 - BASIC ELECTRIC ELEMENTS