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Jonathan Hein
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Bennington, NE, US
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Patents Grants
last 30 patents
Information
Patent Grant
Remote automated chemical crossover system for use with an automate...
Patent number
11,971,421
Issue date
Apr 30, 2024
Elemental Scientific, Inc.
Tyler Yost
G01 - MEASURING TESTING
Information
Patent Grant
System for collecting liquid samples from a distance
Patent number
11,933,698
Issue date
Mar 19, 2024
Elemental Scientific, Inc.
David Diaz
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Systems for integrated decomposition and scanning of a semiconducti...
Patent number
11,804,390
Issue date
Oct 31, 2023
Elemental Scientific, Inc.
Tyler Yost
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Remote automated chemical crossover system for use with an automate...
Patent number
11,703,518
Issue date
Jul 18, 2023
Elemental Scientific, Inc.
Tyler Yost
G01 - MEASURING TESTING
Information
Patent Grant
Systems for integrated decomposition and scanning of a semiconducti...
Patent number
11,705,351
Issue date
Jul 18, 2023
Elemental Scientific, Inc.
Tyler Yost
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Systems for integrated decomposition and scanning of a semiconducti...
Patent number
11,694,914
Issue date
Jul 4, 2023
Elemental Scientific, Inc.
Tyler Yost
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Valve having integrated sensor and stabilized electrical connection
Patent number
11,519,521
Issue date
Dec 6, 2022
Elemental Scientific, Inc.
Daniel R. Wiederin
F16 - ENGINEERING ELEMENTS AND UNITS GENERAL MEASURES FOR PRODUCING AND MAINT...
Information
Patent Grant
Systems for integrated decomposition and scanning of a semiconducti...
Patent number
11,476,134
Issue date
Oct 18, 2022
Elemental Scientific, Inc.
Tyler Yost
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
System for collecting liquid samples
Patent number
11,249,101
Issue date
Feb 15, 2022
Elemental Scientific, Inc.
David Diaz
G01 - MEASURING TESTING
Information
Patent Grant
Systems for integrated decomposition and scanning of a semiconducti...
Patent number
11,244,841
Issue date
Feb 8, 2022
Elemental Scientific, Inc.
Tyler Yost
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Rapid inline preparation of a diluted sample
Patent number
11,056,328
Issue date
Jul 6, 2021
Elemental Scientific, Inc.
Daniel R. Wiederin
G01 - MEASURING TESTING
Information
Patent Grant
System for collecting liquid samples from a distance
Patent number
11,054,344
Issue date
Jul 6, 2021
Elemental Scientific, Inc.
David Diaz
G01 - MEASURING TESTING
Information
Patent Grant
Systems for integrated decomposition and scanning of a semiconducti...
Patent number
11,049,741
Issue date
Jun 29, 2021
Elemental Scientific, Inc.
Tyler Yost
G01 - MEASURING TESTING
Information
Patent Grant
System for collecting liquid sample
Patent number
11,041,835
Issue date
Jun 22, 2021
Elemental Scientific, Inc.
David Diaz
G01 - MEASURING TESTING
Information
Patent Grant
System for collecting liquid samples
Patent number
10,585,108
Issue date
Mar 10, 2020
Elemental Scientific, Inc.
David Diaz
G01 - MEASURING TESTING
Information
Patent Grant
System for collecting liquid samples
Patent number
10,585,075
Issue date
Mar 10, 2020
Elemental Scientific, Inc.
David Diaz
G01 - MEASURING TESTING
Information
Patent Grant
System for collecting liquid samples
Patent number
10,551,401
Issue date
Feb 4, 2020
Elemental Scientific, Inc.
David Diaz
G01 - MEASURING TESTING
Information
Patent Grant
Rapid inline preparation of a diluted sample
Patent number
10,192,726
Issue date
Jan 29, 2019
Elemental Scientific, Inc.
Daniel R. Wiederin
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
SYSTEMS FOR INTEGRATED DECOMPOSITION AND SCANNING OF A SEMICONDUCTI...
Publication number
20240006201
Publication date
Jan 4, 2024
ELEMENTAL SCIENTIFIC, INC.
Tyler Yost
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SYSTEMS FOR INTEGRATED DECOMPOSITION AND SCANNING OF A SEMICONDUCTI...
Publication number
20230395406
Publication date
Dec 7, 2023
ELEMENTAL SCIENTIFIC, INC.
Tyler Yost
G01 - MEASURING TESTING
Information
Patent Application
REMOTE AUTOMATED CHEMICAL CROSSOVER SYSTEM FOR USE WITH AN AUTOMATE...
Publication number
20230375579
Publication date
Nov 23, 2023
ELEMENTAL SCIENTIFIC, INC.
Tyler Yost
G01 - MEASURING TESTING
Information
Patent Application
VALVE HAVING INTEGRATED SENSOR AND STABILIZED ELECTRICAL CONNECTION
Publication number
20230125197
Publication date
Apr 27, 2023
ELEMENTAL SCIENTIFIC, INC.
Daniel R. Wiederin
F16 - ENGINEERING ELEMENTS AND UNITS GENERAL MEASURES FOR PRODUCING AND MAINT...
Information
Patent Application
SYSTEMS FOR INTEGRATED DECOMPOSITION AND SCANNING OF A SEMICONDUCTI...
Publication number
20230111929
Publication date
Apr 13, 2023
ELEMENTAL SCIENTIFIC, INC.
Tyler Yost
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SYSTEM FOR COLLECTING LIQUID SAMPLES
Publication number
20220252630
Publication date
Aug 11, 2022
ELEMENTAL SCIENTIFIC, INC.
David Diaz
G01 - MEASURING TESTING
Information
Patent Application
SYSTEMS FOR INTEGRATED DECOMPOSITION AND SCANNING OF A SEMICONDUCTI...
Publication number
20220189794
Publication date
Jun 16, 2022
ELEMENTAL SCIENTIFIC, INC.
Tyler Yost
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SYSTEM FOR COLLECTING LIQUID SAMPLES FROM A DISTANCE
Publication number
20210381931
Publication date
Dec 9, 2021
ELEMENTAL SCIENTIFIC, INC.
David Diaz
G01 - MEASURING TESTING
Information
Patent Application
SYSTEMS FOR INTEGRATED DECOMPOSITION AND SCANNING OF A SEMICONDUCTI...
Publication number
20210384047
Publication date
Dec 9, 2021
ELEMENTAL SCIENTIFIC, INC.
Tyler Yost
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SYSTEM FOR COLLECTING LIQUID SAMPLES
Publication number
20210382022
Publication date
Dec 9, 2021
ELEMENTAL SCIENTIFIC, INC.
David Diaz
G01 - MEASURING TESTING
Information
Patent Application
REMOTE AUTOMATED CHEMICAL CROSSOVER SYSTEM FOR USE WITH AN AUTOMATE...
Publication number
20210102963
Publication date
Apr 8, 2021
ELEMENTAL SCIENTIFIC, INC.
Tyler Yost
G01 - MEASURING TESTING
Information
Patent Application
SYSTEM FOR COLLECTING LIQUID SAMPLES
Publication number
20200355718
Publication date
Nov 12, 2020
ELEMENTAL SCIENTIFIC, INC.
David Diaz
G01 - MEASURING TESTING
Information
Patent Application
SYSTEM FOR COLLECTING LIQUID SAMPLE
Publication number
20200319149
Publication date
Oct 8, 2020
ELEMENTAL SCIENTIFIC, INC.
David Diaz
G01 - MEASURING TESTING
Information
Patent Application
RAPID INLINE PREPARATION OF A DILUTED SAMPLE
Publication number
20200258731
Publication date
Aug 13, 2020
ELEMENTAL SCIENTIFIC, INC.
Daniel R. Wiederin
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
RAPID INLINE PREPARATION OF A DILUTED SAMPLE
Publication number
20190214241
Publication date
Jul 11, 2019
ELEMENTAL SCIENTIFIC, INC.
Daniel R. Wiederin
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SYSTEMS FOR INTEGRATED DECOMPOSITION AND SCANNING OF A SEMICONDUCTI...
Publication number
20190172731
Publication date
Jun 6, 2019
ELEMENTAL SCIENTIFIC, INC.
Tyler Yost
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SYSTEMS FOR INTEGRATED DECOMPOSITION AND SCANNING OF A SEMICONDUCTI...
Publication number
20190172729
Publication date
Jun 6, 2019
ELEMENTAL SCIENTIFIC, INC.
Tyler Yost
G01 - MEASURING TESTING
Information
Patent Application
SYSTEMS FOR INTEGRATED DECOMPOSITION AND SCANNING OF A SEMICONDUCTI...
Publication number
20190172730
Publication date
Jun 6, 2019
ELEMENTAL SCIENTIFIC, INC.
Tyler Yost
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SYSTEM FOR COLLECTING LIQUID SAMPLES
Publication number
20180180639
Publication date
Jun 28, 2018
ELEMENTAL SCIENTIFIC, INC.
David Diaz
G01 - MEASURING TESTING
Information
Patent Application
SYSTEM FOR COLLECTING LIQUID SAMPLES FROM A DISTANCE
Publication number
20160370262
Publication date
Dec 22, 2016
ELEMENTAL SCIENTIFIC, INC.
David Diaz
G01 - MEASURING TESTING
Information
Patent Application
SYSTEM FOR COLLECTING LIQUID SAMPLES
Publication number
20160305917
Publication date
Oct 20, 2016
ELEMENTAL SCIENTIFIC, INC.
David Diaz
G01 - MEASURING TESTING