Jonathan Iloreta

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Menlo Park, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Visualization of three-dimensional semiconductor structures
- Patent number 11,099,137
- Issue date Aug 24, 2021
- KLA Corporation
- Aaron J. Rosenberg
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Visualization of three-dimensional semiconductor structures
- Patent number 10,794,839
- Issue date Oct 6, 2020
- KLA Corporation
- Aaron J. Rosenberg
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System, method, and computer program product for automatically dete...
- Patent number 10,393,647
- Issue date Aug 27, 2019
- KLA-Tencor Corporation
- Qiang Jimmy Zhao
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device models including re-usable sub-structures
- Patent number 9,553,033
- Issue date Jan 24, 2017
- KLA-Tencor Corporation
- Jonathan Iloreta
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Techniques for optimized scatterometry
- Patent number 9,127,927
- Issue date Sep 8, 2015
- KLA-Tencor Corporation
- Jonathan Iloreta
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Visualization of Three-Dimensional Semiconductor Structures
- Publication number 20200393386
- Publication date Dec 17, 2020
- KLA Corporation
- Aaron J. Rosenberg
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Visualization of Three-Dimensional Semiconductor Structures
- Publication number 20200271595
- Publication date Aug 27, 2020
- KLA-Tencor Corporation
- Aaron J. Rosenberg
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Semiconductor Device Models Including Re-Usable Sub-Structures
- Publication number 20150199463
- Publication date Jul 16, 2015
- KLA-Tencor Corporation
- Jonathan Iloreta
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TECHNIQUES FOR OPTIMIZED SCATTEROMETRY
- Publication number 20130158948
- Publication date Jun 20, 2013
- Jonathan Iloreta
- G01 - MEASURING TESTING