Jonathan J. Muirhead

Person

Tualatin, OR, US

People

Patents Grantslast 30 patents

Information Patent Grant
Puzzle-based pattern analysis and classification
- Patent number 11,704,468
- Issue date Jul 18, 2023
- SIEMENS INDUSTRY SOFTWARE INC.
- Jia-Tze Huang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Puzzle-based pattern analysis and classification
- Patent number 11,023,648
- Issue date Jun 1, 2021
- SIEMENS INDUSTRY SOFTWARE INC.
- Jia-Tze Huang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Pattern-based optical proximity correction
- Patent number 10,691,869
- Issue date Jun 23, 2020
- Mentor Graphics Corporation
- Ahmed Abouelseoud
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Generating root cause candidates for yield analysis
- Patent number 10,496,779
- Issue date Dec 3, 2019
- Mentor Graphics Corporation
- Robert Brady Benware
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Context-aware pattern matching for layout processing
- Patent number 10,496,783
- Issue date Dec 3, 2019
- Mentor Graphics Corporation
- Sherif Hany Riad Mohammed Mousa
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Rule-check waiver
- Patent number 10,089,432
- Issue date Oct 2, 2018
- Mentor Graphics Corporation
- John G. Ferguson
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Generating root cause candidates for yield analysis
- Patent number 9,443,051
- Issue date Sep 13, 2016
- Mentor Graphics Corporation
- Robert Brady Benware
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
PUZZLE-BASED PATTERN ANALYSIS AND CLASSIFICATION
- Publication number 20210248301
- Publication date Aug 12, 2021
- Siemens Industry Software Inc.
- Jia-Tze Huang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Pattern-Based Optical Proximity Correction
- Publication number 20190266311
- Publication date Aug 29, 2019
- Mentor Graphics Corporation
- Ahmed Abouelseoud
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PUZZLE-BASED PATTERN ANALYSIS AND CLASSIFICATION
- Publication number 20190179996
- Publication date Jun 13, 2019
- Mentor Graphics Corporation
- Jia-Tze Huang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Context-Aware Pattern Matching For Layout Processing
- Publication number 20180307791
- Publication date Oct 25, 2018
- Mentor Graphics Corporation
- Sherif Hany Riad Mohammed Mousa
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DESIGN-RULE-CHECK WAIVER
- Publication number 20180260511
- Publication date Sep 13, 2018
- John G. Ferguson
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Logic-Driven Layout Pattern Analysis
- Publication number 20170337300
- Publication date Nov 23, 2017
- Mentor Graphics Corporation
- William Matthew Hogan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
GENERATING ROOT CAUSE CANDIDATES FOR YIELD ANALYSIS
- Publication number 20170103158
- Publication date Apr 13, 2017
- Mentor Graphics Corporation
- Robert Brady Benware
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Logic-Driven Layout Pattern Analysis
- Publication number 20150067621
- Publication date Mar 5, 2015
- Mentor Graphics Corporation
- William Matthew Hogan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Generating Root Cause Candidates For Yield Analysis
- Publication number 20140059511
- Publication date Feb 27, 2014
- Mentor Graphics Corporation
- Robert Brady Benware
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DESIGN-RULE-CHECK WAIVER
- Publication number 20120167028
- Publication date Jun 28, 2012
- John G. Ferguson
- G06 - COMPUTING CALCULATING COUNTING

Jonathan J. Muirhead

Person

Patents Grantslast 30 patents

Puzzle-based pattern analysis and classification

Puzzle-based pattern analysis and classification

Pattern-based optical proximity correction

Generating root cause candidates for yield analysis

Context-aware pattern matching for layout processing

Rule-check waiver

Generating root cause candidates for yield analysis

Patents Applicationslast 30 patents

PUZZLE-BASED PATTERN ANALYSIS AND CLASSIFICATION

Pattern-Based Optical Proximity Correction

PUZZLE-BASED PATTERN ANALYSIS AND CLASSIFICATION

Context-Aware Pattern Matching For Layout Processing

DESIGN-RULE-CHECK WAIVER

Logic-Driven Layout Pattern Analysis

GENERATING ROOT CAUSE CANDIDATES FOR YIELD ANALYSIS

Logic-Driven Layout Pattern Analysis

Generating Root Cause Candidates For Yield Analysis

DESIGN-RULE-CHECK WAIVER