Jonathan K. Winslow, II

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Yorktown Heights, NY, US

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Patents Applicationslast 30 patents

Information Patent Application
CORRELATION AND OVERLAY OF LARGE DESIGN PHYSICAL PARTITIONS AND EMB...
- Publication number 20100174957
- Publication date Jul 8, 2010
- International Business Machines Corporation
- Jonathan K. Winslow, II
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR CREATING ARRAY DEFECT PARETOS USING ELECTRICA...
- Publication number 20080319568
- Publication date Dec 25, 2008
- International Business Machines Corporation
- Zachary E. Berndlmaier
- G06 - COMPUTING CALCULATING COUNTING