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Jonathan Lee
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Orlando, FL, US
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last 30 patents
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Patent Grant
Optical frequency-selective absorber-based infrared detector, metho...
Patent number
11,320,306
Issue date
May 3, 2022
University of Central Florida Research Foundation, Inc.
Debashis Chanda
G01 - MEASURING TESTING
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Patent Grant
Radiation-defect mitigation in InAs/GaSb strained-layer superlattic...
Patent number
11,054,312
Issue date
Jul 6, 2021
University of Central Florida Research Foundation, Inc.
Leonid Chernyak
G01 - MEASURING TESTING
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last 30 patents
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Patent Application
RADIATION-DEFECT MITIGATION IN INAS/GASB STRAINED-LAYER SUPERLATTIC...
Publication number
20190234803
Publication date
Aug 1, 2019
University of Central Florida Research Foundation, Inc.
LEONID CHERNYAK
G01 - MEASURING TESTING
Information
Patent Application
Optical Frequency-Selective Absorber-based Infrared Detector, Metho...
Publication number
20180045560
Publication date
Feb 15, 2018
University of Central Florida Research Foundation, Inc.
Debashis Chanda
G01 - MEASURING TESTING