Jonathan Lutz

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Kitchener, CA

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Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for secure scan testing
- Patent number 7,725,788
- Issue date May 25, 2010
- FREESCALE SEMICONDUCTOR, INC.
- Thomas Tkacik
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus for secure scan testing
- Patent number 7,185,249
- Issue date Feb 27, 2007
- FREESCALE SEMICONDUCTOR, INC.
- Thomas Tkacik
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD AND APPARATUS FOR SECURE SCAN TESTING
- Publication number 20070226562
- Publication date Sep 27, 2007
- FREESCALE SEMICONDUCTOR, INC.
- Thomas Tkacik
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method and apparatus for secure scan testing
- Publication number 20030204801
- Publication date Oct 30, 2003
- MOTOROLA, INC.
- Thomas Tkacik
- G06 - COMPUTING CALCULATING COUNTING