Jonathan R. Fales

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South Burlington, VT, US

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Patents Grantslast 30 patents

Information Patent Grant
Test structure and method for detecting and studying crystal lattic...
- Patent number 7,495,254
- Issue date Feb 24, 2009
- International Business Machines Corporation
- Jonathan R. Fales
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
TEST STRUCTURE AND METHOD FOR DETECTING AND STUDYING CRYSTAL LATTIC...
- Publication number 20070051948
- Publication date Mar 8, 2007
- International Business Machines Corporation
- Jonathan R. Fales
- H01 - BASIC ELECTRIC ELEMENTS