Jonathan R. Fales

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South Burlington, VT, US

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Patents Grantslast 30 patents

Information Patent Grant
Method and system for optimizing migrated implementation of a syste...
- Patent number 8,341,564
- Issue date Dec 25, 2012
- Cadence Design Systems, Inc.
- Jonathan R. Fales
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for random defect yield simulation of chip with b...
- Patent number 7,984,399
- Issue date Jul 19, 2011
- Cadence Design Systems, Inc.
- Roland Ruehl
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Efficient circuit and method to measure resistance thresholds
- Patent number 7,613,047
- Issue date Nov 3, 2009
- International Business Machines Corporation
- Jonathan R. Fales
- G11 - INFORMATION STORAGE
Information Patent Grant
Command multiplier for built-in-self-test
- Patent number 7,194,670
- Issue date Mar 20, 2007
- International Business Machines Corp.
- Jonathan R. Fales
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR CIRCUITS CAPABLE OF SELF DETECTING DEFECTS
- Publication number 20090129185
- Publication date May 21, 2009
- John J. Cassels
- G11 - INFORMATION STORAGE
Information Patent Application
EFFICIENT CIRCUIT AND METHOD TO MEASURE RESISTANCE THRESHOLDS
- Publication number 20080084760
- Publication date Apr 10, 2008
- Jonathan R. Fales
- G11 - INFORMATION STORAGE
Information Patent Application
A Command Multiplier for Built-In-Self-Test
- Publication number 20050193253
- Publication date Sep 1, 2005
- International Business Machines Corporation
- Jonathan R. Fales
- G11 - INFORMATION STORAGE