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Jonathan R. SKUZA
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Williamsburg, VA, US
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last 30 patents
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Patent Grant
X-ray diffraction (XRD) characterization methods for sigma=3 twin d...
Patent number
9,835,570
Issue date
Dec 5, 2017
The United States of America as represented by the Administrator of NASA
Yeonjoon Park
G01 - MEASURING TESTING
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last 30 patents
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Patent Application
X-ray Diffraction (XRD) Characterization Methods for Sigma=3 Twin D...
Publication number
20150078526
Publication date
Mar 19, 2015
U.S.A. Represented by the Administrator of the National Aeronautics and Space...
Yeonjoon Park
G01 - MEASURING TESTING