Jong-I MOU

Person

Hsinpu Township, TW

People

Patents Grantslast 30 patents

Information Patent Grant
Method of test probe alignment control
- Patent number 10,161,965
- Issue date Dec 25, 2018
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Jui-Long Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus and method for chemical mechanical polishing process control
- Patent number 10,096,482
- Issue date Oct 9, 2018
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Keung Hui
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and system for tool condition monitoring based on a simulate...
- Patent number 10,047,439
- Issue date Aug 14, 2018
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Po-Feng Tsai
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Method and/or system for chemical mechanical planarization (CMP)
- Patent number 9,997,420
- Issue date Jun 12, 2018
- Taiwan Semiconductor Manufacturing Company Limited
- Yen-Di Tsen
- B24 - GRINDING POLISHING
Information Patent Grant
System and method for controlling ion implanter
- Patent number 9,870,896
- Issue date Jan 16, 2018
- Taiwan Semiconductor Manufacturing Co., Ltd
- Po-Feng Tsai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Qualitative fault detection and classification system for tool cond...
- Patent number 9,727,049
- Issue date Aug 8, 2017
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Chia-Tong Ho
- G05 - CONTROLLING REGULATING
Information Patent Grant
Real-time calibration for wafer processing chamber lamp modules
- Patent number 9,698,065
- Issue date Jul 4, 2017
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Chih-Tien Chang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Systems and associated methods for tuning processing tools
- Patent number 9,519,285
- Issue date Dec 13, 2016
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Po-Feng Tsai
- G05 - CONTROLLING REGULATING
Information Patent Grant
Dynamic compensation in advanced process control
- Patent number 9,477,219
- Issue date Oct 25, 2016
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Chih-Wei Hsu
- G05 - CONTROLLING REGULATING
Information Patent Grant
Detection of defects on wafer during semiconductor fabrication
- Patent number 9,466,101
- Issue date Oct 11, 2016
- Taiwan Semiconductor Manufacturing Company Limited
- Chun-Hsien Lin
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Scanner overlay correction system and method
- Patent number 9,442,392
- Issue date Sep 13, 2016
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Yen-Di Tsen
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Integrated circuit manufacturing tool condition monitoring system a...
- Patent number 9,349,660
- Issue date May 24, 2016
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Po-Feng Tsai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor fabrication component retuning
- Patent number 9,323,244
- Issue date Apr 26, 2016
- Taiwan Semiconductor Manufacturing Company Limited
- Keung Hui
- G05 - CONTROLLING REGULATING
Information Patent Grant
Systems and methods of automatic boundary control for semiconductor...
- Patent number 9,250,619
- Issue date Feb 2, 2016
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Chih-Wei Hsu
- G05 - CONTROLLING REGULATING
Information Patent Grant
Systems and methods of automatically detecting failure patterns for...
- Patent number 9,165,843
- Issue date Oct 20, 2015
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Jui-Long Chen
- Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information Patent Grant
Semiconductor processing dispatch control
- Patent number 9,158,301
- Issue date Oct 13, 2015
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Sunny Wu
- G05 - CONTROLLING REGULATING
Information Patent Grant
2D/3D analysis for abnormal tools and stages diagnosis
- Patent number 9,158,867
- Issue date Oct 13, 2015
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Chun-Hsien Lin
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Real-time calibration for wafer processing chamber lamp modules
- Patent number 9,159,597
- Issue date Oct 13, 2015
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Chih-Tien Chang
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Adaptive and automatic determination of system parameters
- Patent number 9,141,097
- Issue date Sep 22, 2015
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Po-Feng Tsai
- G05 - CONTROLLING REGULATING
Information Patent Grant
Overlay abnormality gating by Z data
- Patent number 9,123,583
- Issue date Sep 1, 2015
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Chun-Hsien Lin
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for target thickness and surface profile unifo...
- Patent number 9,102,033
- Issue date Aug 11, 2015
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Keung Hui
- B24 - GRINDING POLISHING
Information Patent Grant
Scanner overlay correction system and method
- Patent number 9,082,661
- Issue date Jul 14, 2015
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Yen-Di Tsen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
APC model extension using existing APC models
- Patent number 9,026,239
- Issue date May 5, 2015
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Po-Feng Tsai
- G05 - CONTROLLING REGULATING
Information Patent Grant
Multi-zone temperature control for semiconductor wafer
- Patent number 9,023,664
- Issue date May 5, 2015
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Chun-Lin Chang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of test probe alignment control
- Patent number 9,000,798
- Issue date Apr 7, 2015
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Jui-Long Chen
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods of automatically detecting failure patterns for...
- Patent number 8,938,698
- Issue date Jan 20, 2015
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Jui-Long Chen
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
System and method of dosage profile control
- Patent number 8,925,479
- Issue date Jan 6, 2015
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Keung Hui
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Scanner overlay correction system and method
- Patent number 8,889,434
- Issue date Nov 18, 2014
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Yen-Di Tsen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of optimizing design for manufacturing (DFM)
- Patent number 8,793,638
- Issue date Jul 29, 2014
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Keuing Hui
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Semiconductor processing dispatch control
- Patent number 8,781,614
- Issue date Jul 15, 2014
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Sunny Wu
- G05 - CONTROLLING REGULATING

Patents Applicationslast 30 patents

Information Patent Application
MULTI-ZONE TEMPERATURE CONTROL FOR SEMICONDUCTOR WAFER
- Publication number 20170022611
- Publication date Jan 26, 2017
- Taiwan Semiconductor Manufacturing Co., LTD
- Chun-Lin CHANG
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
Real-Time Calibration for Wafer Processing Chamber Lamp Modules
- Publication number 20160027708
- Publication date Jan 28, 2016
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Chih-Tien Chang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Apparatus and Method for Chemical Mechanical Polishing Process Control
- Publication number 20150348797
- Publication date Dec 3, 2015
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Keung Hui
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MULTI-ZONE TEMPERATURE CONTROL FOR SEMICONDUCTOR WAFER
- Publication number 20150211122
- Publication date Jul 30, 2015
- Taiwan Semiconductor Manufacturing Co., LTD
- Chun-Lin CHANG
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
Method of Test Probe Alignment Control
- Publication number 20150192616
- Publication date Jul 9, 2015
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Jui-Long Chen
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND/OR SYSTEM FOR CHEMICAL MECHANICAL PLANARIZATION (CMP)
- Publication number 20150187662
- Publication date Jul 2, 2015
- Taiwan Semiconductor Manufacturing Company Limited
- Yen-Di Tsen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SCANNER OVERLAY CORRECTION SYSTEM AND METHOD
- Publication number 20150170904
- Publication date Jun 18, 2015
- Taiwan Semiconductor Manufacturing Co., LTD
- Yen-Di TSEN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEM AND METHOD FOR CONTROLLING ION IMPLANTER
- Publication number 20150162166
- Publication date Jun 11, 2015
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Po-Feng TSAI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEMS AND METHODS OF AUTOMATICALLY DETECTING FAILURE PATTERNS FOR...
- Publication number 20150125970
- Publication date May 7, 2015
- Taiwan Semiconductor Manufacturing Co., LTD
- Jui-Long CHEN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR FABRICATION COMPONENT RETUNING
- Publication number 20150081081
- Publication date Mar 19, 2015
- Taiwan Semiconductor Manufacturing Company Limited
- Keung Hui
- G05 - CONTROLLING REGULATING
Information Patent Application
SCANNER OVERLAY CORRECTION SYSTEM AND METHOD
- Publication number 20150027636
- Publication date Jan 29, 2015
- Taiwan Semiconductor Manufacturing Co., LTD
- Yen-Di TSEN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Overlay Abnormality Gating by Z Data
- Publication number 20150015870
- Publication date Jan 15, 2015
- Taiwan Semiconductor Manufacturing Co., LTD
- Chun-Hsien Lin
- G01 - MEASURING TESTING
Information Patent Application
DETECTION OF DEFECTS ON WAFER DURING SEMICONDUCTOR FABRICATION
- Publication number 20140328534
- Publication date Nov 6, 2014
- Taiwan Semiconductor Manufacturing Company Limited
- CHUN-HSIEN LIN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Semiconductor Processing Dispatch Control
- Publication number 20140303765
- Publication date Oct 9, 2014
- Sunny Wu
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Application
TOOL OPTIMIZING TUNING SYSTEMS AND ASSOCIATED METHODS
- Publication number 20140207271
- Publication date Jul 24, 2014
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Po-Feng Tsai
- G05 - CONTROLLING REGULATING
Information Patent Application
SCANNER OVERLAY CORRECTION SYSTEM AND METHOD
- Publication number 20140170782
- Publication date Jun 19, 2014
- Taiwan Semiconductor Manufacturing Co., LTD
- Yen-Di TSEN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEMS AND METHODS OF AUTOMATICALLY DETECTING FAILURE PATTERNS FOR...
- Publication number 20140106474
- Publication date Apr 17, 2014
- Taiwan Semiconductor Manufacturing Co., LTD
- Jui-Long CHEN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
2D/3D Analysis for Abnormal Tools and Stages Diagnosis
- Publication number 20140100684
- Publication date Apr 10, 2014
- Taiwan Semiconductor Manufacturing Co. Ltd.
- Chun-Hsien Lin
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ADAPTIVE AND AUTOMATIC DETERMINATION OF SYSTEM PARAMETERS
- Publication number 20140074258
- Publication date Mar 13, 2014
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Po-Feng TSAI
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Application
QUALITATIVE FAULT DETECTION AND CLASSIFICATION SYSTEM FOR TOOL COND...
- Publication number 20140067324
- Publication date Mar 6, 2014
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Chia-Tong Ho
- G05 - CONTROLLING REGULATING
Information Patent Application
Method of Optimizing Design for Manufacturing (DFM)
- Publication number 20140033159
- Publication date Jan 30, 2014
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Keuing Hui
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD OF TEST PROBE ALIGNMENT CONTROL
- Publication number 20130335109
- Publication date Dec 19, 2013
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Jui-Long Chen
- G01 - MEASURING TESTING
Information Patent Application
REAL-TIME CALIBRATION FOR WAFER PROCESSING CHAMBER LAMP MODULES
- Publication number 20130306621
- Publication date Nov 21, 2013
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Chih-Tien Chang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEMS AND METHODS OF AUTOMATICALLY DETECTING FAILURE PATTERNS FOR...
- Publication number 20130288403
- Publication date Oct 31, 2013
- Taiwan Semiconductor Manufacturing Co., LTD
- Jui-Long CHEN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MULTI-ZONE TEMPERATURE CONTROL FOR SEMICONDUCTOR WAFER
- Publication number 20130171746
- Publication date Jul 4, 2013
- TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.
- Chun-Lin Chang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND SYSTEM FOR TOOL CONDITION MONITORING
- Publication number 20130150997
- Publication date Jun 13, 2013
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Po-Feng Tsai
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
SYSTEMS AND METHODS OF AUTOMATIC BOUNDARY CONTROL FOR SEMICONDUCTOR...
- Publication number 20130144423
- Publication date Jun 6, 2013
- TAIWAN SEMICONDUCTOR MANUFACTURING, CO., LTD.
- Chih-Wei HSU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INTEGRATED CIRCUIT MANUFACTURING TOOL CONDITION MONITORING SYSTEM A...
- Publication number 20130144419
- Publication date Jun 6, 2013
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Po-Feng Tsai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
System and Method of Dosage Profile Control
- Publication number 20130068162
- Publication date Mar 21, 2013
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Keung Hui
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
Semiconductor Processing Dispatch Control
- Publication number 20130013097
- Publication date Jan 10, 2013
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Sunny Wu
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...

Person

Patents Grantslast 30 patents

Method of test probe alignment control

Apparatus and method for chemical mechanical polishing process control

Method and system for tool condition monitoring based on a simulate...

Method and/or system for chemical mechanical planarization (CMP)

System and method for controlling ion implanter

Qualitative fault detection and classification system for tool cond...

Real-time calibration for wafer processing chamber lamp modules

Systems and associated methods for tuning processing tools

Dynamic compensation in advanced process control

Detection of defects on wafer during semiconductor fabrication

Scanner overlay correction system and method

Integrated circuit manufacturing tool condition monitoring system a...

Semiconductor fabrication component retuning

Systems and methods of automatic boundary control for semiconductor...

Systems and methods of automatically detecting failure patterns for...

Semiconductor processing dispatch control

2D/3D analysis for abnormal tools and stages diagnosis

Real-time calibration for wafer processing chamber lamp modules

Adaptive and automatic determination of system parameters

Overlay abnormality gating by Z data

Apparatus and method for target thickness and surface profile unifo...

Scanner overlay correction system and method

APC model extension using existing APC models

Multi-zone temperature control for semiconductor wafer

Method of test probe alignment control

Systems and methods of automatically detecting failure patterns for...

System and method of dosage profile control

Scanner overlay correction system and method

Method of optimizing design for manufacturing (DFM)

Semiconductor processing dispatch control

Patents Applicationslast 30 patents

MULTI-ZONE TEMPERATURE CONTROL FOR SEMICONDUCTOR WAFER

Real-Time Calibration for Wafer Processing Chamber Lamp Modules

Apparatus and Method for Chemical Mechanical Polishing Process Control

MULTI-ZONE TEMPERATURE CONTROL FOR SEMICONDUCTOR WAFER

Method of Test Probe Alignment Control

METHOD AND/OR SYSTEM FOR CHEMICAL MECHANICAL PLANARIZATION (CMP)

SCANNER OVERLAY CORRECTION SYSTEM AND METHOD

SYSTEM AND METHOD FOR CONTROLLING ION IMPLANTER

SYSTEMS AND METHODS OF AUTOMATICALLY DETECTING FAILURE PATTERNS FOR...

SEMICONDUCTOR FABRICATION COMPONENT RETUNING

SCANNER OVERLAY CORRECTION SYSTEM AND METHOD

Overlay Abnormality Gating by Z Data

DETECTION OF DEFECTS ON WAFER DURING SEMICONDUCTOR FABRICATION

Semiconductor Processing Dispatch Control

TOOL OPTIMIZING TUNING SYSTEMS AND ASSOCIATED METHODS

SCANNER OVERLAY CORRECTION SYSTEM AND METHOD

SYSTEMS AND METHODS OF AUTOMATICALLY DETECTING FAILURE PATTERNS FOR...

2D/3D Analysis for Abnormal Tools and Stages Diagnosis

ADAPTIVE AND AUTOMATIC DETERMINATION OF SYSTEM PARAMETERS

QUALITATIVE FAULT DETECTION AND CLASSIFICATION SYSTEM FOR TOOL COND...

Method of Optimizing Design for Manufacturing (DFM)

METHOD OF TEST PROBE ALIGNMENT CONTROL

REAL-TIME CALIBRATION FOR WAFER PROCESSING CHAMBER LAMP MODULES

SYSTEMS AND METHODS OF AUTOMATICALLY DETECTING FAILURE PATTERNS FOR...

MULTI-ZONE TEMPERATURE CONTROL FOR SEMICONDUCTOR WAFER

METHOD AND SYSTEM FOR TOOL CONDITION MONITORING

SYSTEMS AND METHODS OF AUTOMATIC BOUNDARY CONTROL FOR SEMICONDUCTOR...

INTEGRATED CIRCUIT MANUFACTURING TOOL CONDITION MONITORING SYSTEM A...

System and Method of Dosage Profile Control

Semiconductor Processing Dispatch Control