JONGCHEON SUN

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Patents Grantslast 30 patents

Information Patent Grant
Substrate inspection apparatus and substrate inspection method
- Patent number 12,352,808
- Issue date Jul 8, 2025
- Samsung Electronics Co., Ltd.
- Sekye Jeon
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
WAFER INSPECTION METHOD
- Publication number 20250231121
- Publication date Jul 17, 2025
- Samsung Electronics Co., Ltd.
- Doyoung Yoon
- G01 - MEASURING TESTING
Information Patent Application
SCANNING ELECTRON MICROSCOPE DEVICE
- Publication number 20250218721
- Publication date Jul 3, 2025
- Samsung Electronics Co., Ltd.
- Jinwoo Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF GENERATING DEFECT CLASSIFICATION MODEL
- Publication number 20250037486
- Publication date Jan 30, 2025
- Samsung Electronics Co., Ltd.
- Jinwoo LEE
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SUBSTRATE INSPECTION APPARATUS AND SUBSTRATE INSPECTION METHOD
- Publication number 20240175915
- Publication date May 30, 2024
- Samsung Electronics Co., Ltd.
- SEKYE JEON
- G01 - MEASURING TESTING