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Jongheon Jeong
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Palo Alto, CA, US
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last 30 patents
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Patent Grant
Testing for shorts between internal nodes of a power distribution grid
Patent number
9,453,870
Issue date
Sep 27, 2016
Xilinx, Inc.
Amitava Majumdar
G01 - MEASURING TESTING
Information
Patent Grant
Methods of making integrated circuit products
Patent number
9,012,245
Issue date
Apr 21, 2015
Xilinx, Inc.
Matthew H. Klein
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method and apparatus for self-regulated burn-in of an integrated ci...
Patent number
8,212,576
Issue date
Jul 3, 2012
Xilinx, Inc.
Jae Cho
G01 - MEASURING TESTING
Information
Patent Grant
Three-terminal non-volatile memory element with hybrid gate dielectric
Patent number
7,687,797
Issue date
Mar 30, 2010
Xilinx, Inc.
James Karp
G11 - INFORMATION STORAGE
Information
Patent Grant
Non-volatile memory cell with charge storage element and method of...
Patent number
7,544,968
Issue date
Jun 9, 2009
Xilinx, Inc.
Shahin Toutounchi
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
PMOS three-terminal non-volatile memory element and method of progr...
Patent number
7,450,431
Issue date
Nov 11, 2008
Xilinx, Inc.
James Karp
G11 - INFORMATION STORAGE
Information
Patent Grant
Method of programming a three-terminal non-volatile memory element...
Patent number
7,420,842
Issue date
Sep 2, 2008
Xilinx, Inc.
Michael G. Ahrens
G11 - INFORMATION STORAGE
Information
Patent Grant
Ballast resistor with reduced area for ESD protection
Patent number
6,740,936
Issue date
May 25, 2004
Xilinx, Inc.
Daniel Gitlin
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Non-volatile memory array using gate breakdown structures
Patent number
6,549,458
Issue date
Apr 15, 2003
Xilinx, Inc.
Kameswara K. Rao
G11 - INFORMATION STORAGE
Information
Patent Grant
Non-volatile memory array using gate breakdown structures
Patent number
6,522,582
Issue date
Feb 18, 2003
Xilinx, Inc.
Kameswara K. Rao
G11 - INFORMATION STORAGE