Jongsu KIM

Person

Seongnam-si, KR

People

Patents Grantslast 30 patents

Information Patent Grant
Electronic device and payment method using the same
- Patent number 12,093,955
- Issue date Sep 17, 2024
- Samsung Electronics Co., Ltd.
- Gawon Lee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Electronic device and method of backing up secure element
- Patent number 12,026,064
- Issue date Jul 2, 2024
- Samsung Electronics Co., Ltd.
- Donghoon Lee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Electronic device for providing service by using secure element, an...
- Patent number 11,921,857
- Issue date Mar 5, 2024
- Samsung Electronics Co., Ltd.
- Taeckki Lee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Substrate supporting unit and a substrate processing device includi...
- Patent number 11,866,823
- Issue date Jan 9, 2024
- ASM IP Holding B.V.
- SeungHwan Lee
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Thickness estimation method and processing control method
- Patent number 11,668,558
- Issue date Jun 6, 2023
- Samsung Electronics Co., Ltd.
- Jongsu Kim
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Wafer inspection apparatus and method
- Patent number 11,579,096
- Issue date Feb 14, 2023
- Samsung Electronics Co., Ltd.
- Sungha Kim
- G01 - MEASURING TESTING
Information Patent Grant
Substrate supporting unit and a substrate processing device includi...
- Patent number 11,499,226
- Issue date Nov 15, 2022
- ASM IP Holding B.V.
- SeungHwan Lee
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Semiconductor substrate measuring apparatus and plasma treatment ap...
- Patent number 11,488,875
- Issue date Nov 1, 2022
- Samsung Electronics Co., Ltd.
- Junbum Park
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Optical emission spectroscopy calibration device and system includi...
- Patent number 10,871,396
- Issue date Dec 22, 2020
- Samsung Electronics Co., Ltd.
- Jongsu Kim
- G02 - OPTICS

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR DEVICE AND METHOD OF FABRICATING THE SAME
- Publication number 20250015157
- Publication date Jan 9, 2025
- Samsung Electronics Co., Ltd.
- Beomjin Park
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE HAVING TEST PATTERN
- Publication number 20250006654
- Publication date Jan 2, 2025
- Samsung Electronics Co., Ltd.
- Seunghye BAEK
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE
- Publication number 20240405073
- Publication date Dec 5, 2024
- Samsung Electronics Co., Ltd.
- Hyumin Yoo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE AND METHOD OF FABRICATING THE SAME
- Publication number 20240355883
- Publication date Oct 24, 2024
- Samsung Electronics Co., Ltd.
- Hyumin YOO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE AND METHOD OF FABRICATING THE SAME
- Publication number 20240321884
- Publication date Sep 26, 2024
- Samsung Electronics Co., Ltd.
- Inhyun SONG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INTEGRATED CIRCUIT DEVICE
- Publication number 20240321961
- Publication date Sep 26, 2024
- Samsung Electronics Co., Ltd.
- Jongsu Kim
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE
- Publication number 20240322012
- Publication date Sep 26, 2024
- Samsung Electronics Co., Ltd.
- Byeonghee Son
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE
- Publication number 20240282576
- Publication date Aug 22, 2024
- Samsung Electronics Co.,Ltd.
- Hyungju RYU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
GAS INLET TUBE ASSEMBLY FOR AN IMPROVED GAS MIXTURE IN A SUBSTRATE...
- Publication number 20240124981
- Publication date Apr 18, 2024
- ASM IP HOLDING B.V.
- Arun Thottappayil
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
PROBE AND INSPECTION APPARATUS INCLUDING THE SAME
- Publication number 20240019362
- Publication date Jan 18, 2024
- Samsung Electronics Co., Ltd.
- Junbum Park
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR DEVICE
- Publication number 20230260925
- Publication date Aug 17, 2023
- Samsung Electronics Co., Ltd.
- Jeonghyun KIM
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRONIC DEVICE AND PAYMENT METHOD USING THE SAME
- Publication number 20230114336
- Publication date Apr 13, 2023
- Samsung Electronics Co., Ltd.
- Gawon LEE
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SUBSTRATE SUPPORTING UNIT AND A SUBSTRATE PROCESSING DEVICE INCLUDI...
- Publication number 20230052239
- Publication date Feb 16, 2023
- ASM IP HOLDING B.V.
- SeungHwan Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRONIC DEVICE AND METHOD OF BACKING UP SECURE ELEMENT
- Publication number 20230029025
- Publication date Jan 26, 2023
- Samsung Electronics Co., Ltd.
- Donghoon LEE
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
THICKNESS ESTIMATION METHOD AND PROCESSING CONTROL METHOD
- Publication number 20220065618
- Publication date Mar 3, 2022
- Samsung Electronics Co., Ltd.
- Jongsu Kim
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ELECTRONIC DEVICE FOR PROVIDING SERVICE BY USING SECURE ELEMENT, AN...
- Publication number 20220035921
- Publication date Feb 3, 2022
- Samsung Electronics Co., Ltd.
- Taeckki LEE
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
WAFER INSPECTION APPARATUS AND METHOD
- Publication number 20210341396
- Publication date Nov 4, 2021
- Samsung Electronics Co., Ltd.
- Sungha KIM
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR SUBSTRATE MEASURING APPARATUS AND PLASMA TREATMENT AP...
- Publication number 20210074594
- Publication date Mar 11, 2021
- Samsung Electronics Co., Ltd.
- Junbum PARK
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
OPTICAL EMISSION SPECTROSCOPY CALIBRATION DEVICE AND SYSTEM INCLUDI...
- Publication number 20200319025
- Publication date Oct 8, 2020
- Samsung Electronics Co., Ltd.
- Jongsu KIM
- G01 - MEASURING TESTING
Information Patent Application
SUBSTRATE SUPPORTING UNIT AND A SUBSTRATE PROCESSING DEVICE INCLUDI...
- Publication number 20200141003
- Publication date May 7, 2020
- ASM IP HOLDING B.V.
- SeungHwan Lee
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...

Person

Patents Grantslast 30 patents

Electronic device and payment method using the same

Electronic device and method of backing up secure element

Electronic device for providing service by using secure element, an...

Substrate supporting unit and a substrate processing device includi...

Thickness estimation method and processing control method

Wafer inspection apparatus and method

Substrate supporting unit and a substrate processing device includi...

Semiconductor substrate measuring apparatus and plasma treatment ap...

Optical emission spectroscopy calibration device and system includi...

Patents Applicationslast 30 patents

SEMICONDUCTOR DEVICE AND METHOD OF FABRICATING THE SAME

SEMICONDUCTOR DEVICE HAVING TEST PATTERN

SEMICONDUCTOR DEVICE

SEMICONDUCTOR DEVICE AND METHOD OF FABRICATING THE SAME

SEMICONDUCTOR DEVICE AND METHOD OF FABRICATING THE SAME

INTEGRATED CIRCUIT DEVICE

SEMICONDUCTOR DEVICE

METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE

GAS INLET TUBE ASSEMBLY FOR AN IMPROVED GAS MIXTURE IN A SUBSTRATE...

PROBE AND INSPECTION APPARATUS INCLUDING THE SAME

SEMICONDUCTOR DEVICE

ELECTRONIC DEVICE AND PAYMENT METHOD USING THE SAME

SUBSTRATE SUPPORTING UNIT AND A SUBSTRATE PROCESSING DEVICE INCLUDI...

ELECTRONIC DEVICE AND METHOD OF BACKING UP SECURE ELEMENT

THICKNESS ESTIMATION METHOD AND PROCESSING CONTROL METHOD

ELECTRONIC DEVICE FOR PROVIDING SERVICE BY USING SECURE ELEMENT, AN...

WAFER INSPECTION APPARATUS AND METHOD

SEMICONDUCTOR SUBSTRATE MEASURING APPARATUS AND PLASMA TREATMENT AP...

OPTICAL EMISSION SPECTROSCOPY CALIBRATION DEVICE AND SYSTEM INCLUDI...

SUBSTRATE SUPPORTING UNIT AND A SUBSTRATE PROCESSING DEVICE INCLUDI...