Jongyoon Shin

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Daejeon-si, KR

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Patents Grantslast 30 patents

Information Patent Grant
Apparatus and method for measuring a delay
- Patent number 9,112,603
- Issue date Aug 18, 2015
- Electronics and Telecommunications Research Institute
- Jongyoon Shin
- H04 - ELECTRIC COMMUNICATION TECHNIQUE

Patents Applicationslast 30 patents

Information Patent Application
APPARATUS AND METHOD FOR MEASURING A DELAY
- Publication number 20130129347
- Publication date May 23, 2013
- ELECTRONICS AND TELECOMMUNICATIONS RESEARCH INSTIT
- Jongyoon Shin
- H04 - ELECTRIC COMMUNICATION TECHNIQUE