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Joonhyung Kwon
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Gunpo City, KR
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Patents Grants
last 30 patents
Information
Patent Grant
Scanning probe microscope with improved probe head mount
Patent number
6,951,129
Issue date
Oct 4, 2005
PSIA Corporation
Joonhyung Kwon
G01 - MEASURING TESTING
Information
Patent Grant
Scanning probe microscope with improved probe tip mount
Patent number
6,945,100
Issue date
Sep 20, 2005
PSIA Corporation
Joonhyung Kwon
G01 - MEASURING TESTING
Information
Patent Grant
Scanning probe microscope with improved scan accuracy, scan speed,...
Patent number
6,677,567
Issue date
Jan 13, 2004
PSIA Corporation
Jaewan Hong
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
Scanning capacitance microscope, method of driving the same, and re...
Publication number
20070012093
Publication date
Jan 18, 2007
PSIA Co, LTD
Joonhyung Kwon
G01 - MEASURING TESTING
Information
Patent Application
Scanning probe microscope with improved probe tip mount
Publication number
20040140424
Publication date
Jul 22, 2004
PSIA Corporation
Joonhyung Kwon
G01 - MEASURING TESTING
Information
Patent Application
Scanning probe microscope with improved probe head mount
Publication number
20040140426
Publication date
Jul 22, 2004
PSIA Corporation
Joonhyung Kwon
G01 - MEASURING TESTING
Information
Patent Application
Scanning probe microscope
Publication number
20030155481
Publication date
Aug 21, 2003
Jaewan Hong
G01 - MEASURING TESTING