Joonseo Song

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Seoul, KR

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Patents Grantslast 30 patents

Information Patent Grant
Method of inspecting semiconductor wafer, inspection system for per...
- Patent number 11,004,712
- Issue date May 11, 2021
- Samsung Electronics Co., Ltd.
- Sung Yoon Ryu
- G01 - MEASURING TESTING
Information Patent Grant
Method of inspecting semiconductor wafer, an inspection system for...
- Patent number 10,269,111
- Issue date Apr 23, 2019
- Samsung Electronics Co., Ltd.
- Joonseo Song
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
WAFER MEASUREMENT APPARATUS AND OPERATING METHOD THEREOF
- Publication number 20240248051
- Publication date Jul 25, 2024
- Samsung Electronics Co., Ltd.
- Jaehyung AHN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD OF INSPECTING SEMICONDUCTOR WAFER, INSPECTION SYSTEM FOR PER...
- Publication number 20200176292
- Publication date Jun 4, 2020
- Samsung Electronics Co,Ltd.
- Sung Yoon RYU
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD OF INSPECTING SEMICONDUCTOR WAFER, AN INSPECTION SYSTEM FOR...
- Publication number 20180053292
- Publication date Feb 22, 2018
- Samsung Electronics Co., Ltd.
- Joonseo Song
- G06 - COMPUTING CALCULATING COUNTING