Joonyeon Kim

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Seongnam-si, KR

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Patents Grantslast 30 patents

Information Patent Grant
Probe card, and apparatus and method for testing semiconductor devi...
- Patent number 8,493,087
- Issue date Jul 23, 2013
- Samsung Electronics Co., Ltd.
- Chang-Hyun Cho
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
TEST DEVICE, OPERATING METHOD OF TEST DEVICE, AND SEMICONDUCTOR DEV...
- Publication number 20250149107
- Publication date May 8, 2025
- Samsung Electronics Co., Ltd.
- Sehoon Park
- G11 - INFORMATION STORAGE
Information Patent Application
Probe card, and apparatus and method for testing semiconductor devi...
- Publication number 20100148811
- Publication date Jun 17, 2010
- Chang-Hyun Cho
- G01 - MEASURING TESTING