JOOSEONG KIM

Person

SEOUL, KR

People

Patents Grantslast 30 patents

Information Patent Grant
Built-in self-test circuit and temperature measurement circuit incl...
- Patent number 12,345,762
- Issue date Jul 1, 2025
- Samsung Electronics Co., Ltd.
- Junhee Shin
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Electronic device
- Patent number 12,079,023
- Issue date Sep 3, 2024
- Samsung Electronics Co., Ltd.
- Jeongpyo Park
- G05 - CONTROLLING REGULATING
Information Patent Grant
Electronic device with a reference voltage generator circuit and an...
- Patent number 11,797,040
- Issue date Oct 24, 2023
- Samsung Electronics Co., Ltd.
- Jeongpyo Park
- G05 - CONTROLLING REGULATING
Information Patent Grant
Built-in self-test circuit and temperature measurement circuit incl...
- Patent number 11,686,766
- Issue date Jun 27, 2023
- Samsung Electronics Co., Ltd.
- Junhee Shin
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Temperature sensing device and temperature-voltage converter
- Patent number 10,656,023
- Issue date May 19, 2020
- Samsung Electronics Co., Ltd.
- Jooseong Kim
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
BUILT-IN SELF-TEST CIRCUIT AND TEMPERATURE MEASUREMENT CIRCUIT INCL...
- Publication number 20250076377
- Publication date Mar 6, 2025
- Samsung Electronics Co., Ltd.
- Junhee Shin
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
SWITCH CONTROL VOLTAGE GENERATOR, BANDGAP REFERENCE GENERATOR, AND...
- Publication number 20250021122
- Publication date Jan 16, 2025
- Samsung Electronics Co., Ltd.
- Haejung CHOI
- G05 - CONTROLLING REGULATING
Information Patent Application
ELECTRONIC DEVICE
- Publication number 20240019886
- Publication date Jan 18, 2024
- Samsung Electronics Co., Ltd.
- Jeongpyo PARK
- G05 - CONTROLLING REGULATING
Information Patent Application
BUILT-IN SELF-TEST CIRCUIT AND TEMPERATURE MEASUREMENT CIRCUIT INCL...
- Publication number 20230280398
- Publication date Sep 7, 2023
- Samsung Electronics Co., Ltd.
- Junhee Shin
- G01 - MEASURING TESTING
Information Patent Application
ELECTRONIC DEVICE
- Publication number 20220171420
- Publication date Jun 2, 2022
- Samsung Electronics Co., Ltd.
- Jeongpyo PARK
- G05 - CONTROLLING REGULATING
Information Patent Application
BUILT-IN SELF-TEST CIRCUIT AND TEMPERATURE MEASUREMENT CIRCUIT INCL...
- Publication number 20210199719
- Publication date Jul 1, 2021
- Samsung Electronics Co., Ltd.
- Junhee Shin
- G01 - MEASURING TESTING
Information Patent Application
TEMPERATURE SENSING DEVICE AND TEMPERATURE-VOLTAGE CONVERTER
- Publication number 20190226922
- Publication date Jul 25, 2019
- Samsung Electronics Co., Ltd.
- JOOSEONG KIM
- G05 - CONTROLLING REGULATING

JOOSEONG KIM

Person

Patents Grantslast 30 patents

Built-in self-test circuit and temperature measurement circuit incl...

Electronic device

Electronic device with a reference voltage generator circuit and an...

Built-in self-test circuit and temperature measurement circuit incl...

Temperature sensing device and temperature-voltage converter

Patents Applicationslast 30 patents

BUILT-IN SELF-TEST CIRCUIT AND TEMPERATURE MEASUREMENT CIRCUIT INCL...

SWITCH CONTROL VOLTAGE GENERATOR, BANDGAP REFERENCE GENERATOR, AND...

ELECTRONIC DEVICE

BUILT-IN SELF-TEST CIRCUIT AND TEMPERATURE MEASUREMENT CIRCUIT INCL...

ELECTRONIC DEVICE

BUILT-IN SELF-TEST CIRCUIT AND TEMPERATURE MEASUREMENT CIRCUIT INCL...

TEMPERATURE SENSING DEVICE AND TEMPERATURE-VOLTAGE CONVERTER