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Joost van Groen
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Utrecht, NL
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last 30 patents
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Patent Grant
Method and apparatus for mapping of wafers located inside a closed...
Patent number
7,015,492
Issue date
Mar 21, 2006
ASM International N.V
Adriaan Garssen
G01 - MEASURING TESTING
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last 30 patents
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Patent Application
Method for sensing wafers located inside a closed wafer cassette
Publication number
20060131521
Publication date
Jun 22, 2006
Adriaan Garssen
G01 - MEASURING TESTING