Jorg Bischoff

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Ilmenau, DE

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Patents Applicationslast 30 patents

Information Patent Application
Scatterometric measuring arrangement and measuring method
- Publication number 20040196460
- Publication date Oct 7, 2004
- Hans-Jurgen Dobschal
- G01 - MEASURING TESTING
Information Patent Application
Array for reducing the coherence of a coherent radiation beam
- Publication number 20040179364
- Publication date Sep 16, 2004
- Matthias Burkhardt
- G02 - OPTICS
Information Patent Application
Measuring array
- Publication number 20040145744
- Publication date Jul 29, 2004
- Hans-Jurgen Dobschal
- G01 - MEASURING TESTING