Jorg Stippler

Follow

Person

Munchen, DE

People

Patents Grantslast 30 patents

Information Patent Grant
Method and magazine device for testing semiconductor devices
- Patent number 6,777,924
- Issue date Aug 17, 2004
- Infineon Technologies AG
- Björn Flach
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Method and magazine device for testing semiconductor devices
- Publication number 20030173950
- Publication date Sep 18, 2003
- Bjorn Flach
- G01 - MEASURING TESTING