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Jorge Arturo Corso Sarmiento
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Austin, TX, US
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last 30 patents
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Patent Grant
Built in self test (BIST) for clock generation circuitry
Patent number
11,821,946
Issue date
Nov 21, 2023
NXP USA, INC.
Jorge Arturo Corso Sarmiento
G06 - COMPUTING CALCULATING COUNTING
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Patent Grant
Devices and methods for preventing errors and detecting faults with...
Patent number
11,769,567
Issue date
Sep 26, 2023
NXP USA, INC.
Jehoda Refaeli
G11 - INFORMATION STORAGE
Patents Applications
last 30 patents
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Patent Application
BUILT IN SELF TEST (BIST) FOR CLOCK GENERATION CIRCUITRY
Publication number
20230079000
Publication date
Mar 16, 2023
NXP USA, Inc.
Jorge Arturo Corso Sarmiento
G01 - MEASURING TESTING