Jorge Filevich

Person

Portland, OR, US

People

Patents Grantslast 30 patents

Information Patent Grant
Concurrent laser cleaning and spectroscopic cleanliness monitoring
- Patent number 12,158,372
- Issue date Dec 3, 2024
- FEI Company
- Joseph Christian
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Combined SEM-CL and FIB-IOE microscopy
- Patent number 10,896,802
- Issue date Jan 19, 2021
- FEI Company
- Mostafa Maazouz
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for alignment of a light beam to a charged particle beam
- Patent number 10,777,383
- Issue date Sep 15, 2020
- FEI Company
- Cameron James Zachreson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Lamella-shaped targets for x-ray generation
- Patent number 10,746,672
- Issue date Aug 18, 2020
- FEI Company
- Jorge Filevich
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Tomography sample preparation systems and methods with improved spe...
- Patent number 10,190,953
- Issue date Jan 29, 2019
- Guillaume Delpy
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Integrated light optics and gas delivery in a charged particle lens
- Patent number 9,478,390
- Issue date Oct 25, 2016
- FEI Company
- N. William Parker
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged-particle lens that transmits emissions from sample
- Patent number 9,349,564
- Issue date May 24, 2016
- FEI Company
- N. William Parker
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
CONCURRENT LASER CLEANING AND SPECTROSCOPIC CLEANLINESS MONITORING
- Publication number 20230393074
- Publication date Dec 7, 2023
- FEI Company
- Joseph Christian
- G01 - MEASURING TESTING
Information Patent Application
PHOTON-INDUCED ION SOURCE
- Publication number 20210183608
- Publication date Jun 17, 2021
- FEI Company
- Kun LIU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
COMBINED SEM-CL AND FIB-IOE MICROSCOPY
- Publication number 20190198288
- Publication date Jun 27, 2019
- FEI Company
- Mostafa Maazouz
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
LAMELLA-SHAPED TARGETS FOR X-RAY GENERATION
- Publication number 20190017942
- Publication date Jan 17, 2019
- FEI Company
- Jorge Filevich
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR ALIGNMENT OF A LIGHT BEAM TO A CHARGED PARTICLE BEAM
- Publication number 20190013178
- Publication date Jan 10, 2019
- FEI Company
- Cameron James Zachreson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged-Particle Lens that Transmits Emissions from Sample
- Publication number 20160020062
- Publication date Jan 21, 2016
- FEI Company
- N. William Parker
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INTEGRATED LIGHT OPTICS AND GAS DELIVERY IN A CHARGED PARTICLE LENS
- Publication number 20150380205
- Publication date Dec 31, 2015
- FEI Company
- N. William Parker
- H01 - BASIC ELECTRIC ELEMENTS

Jorge Filevich

Person

Patents Grantslast 30 patents

Concurrent laser cleaning and spectroscopic cleanliness monitoring

Combined SEM-CL and FIB-IOE microscopy

Method for alignment of a light beam to a charged particle beam

Lamella-shaped targets for x-ray generation

Tomography sample preparation systems and methods with improved spe...

Integrated light optics and gas delivery in a charged particle lens

Charged-particle lens that transmits emissions from sample

Patents Applicationslast 30 patents

CONCURRENT LASER CLEANING AND SPECTROSCOPIC CLEANLINESS MONITORING

PHOTON-INDUCED ION SOURCE

COMBINED SEM-CL AND FIB-IOE MICROSCOPY

LAMELLA-SHAPED TARGETS FOR X-RAY GENERATION

METHOD FOR ALIGNMENT OF A LIGHT BEAM TO A CHARGED PARTICLE BEAM

Charged-Particle Lens that Transmits Emissions from Sample

INTEGRATED LIGHT OPTICS AND GAS DELIVERY IN A CHARGED PARTICLE LENS